Specifications

Sample cooling assembly

Type:2-stage flow cryostat (sample + radiation shield)
Radiation shielding:Radiation shield with top viewport surrounds sample
Cooling source:Liquid helium (LHe) or liquid nitrogen (LN2)
  
Magnetic field:Ring magnet kit

Temperature

Base temperature Control range Configuration
4.3 K4.4 K to 475 K2 probe arms installed
4.325 K4.4 K to 475 K4 probe arms installed
4.35 K4.4 K to 475 K6 probe arms installed
3.2 K3.3 K to 475 Kwith PS-LT option
20 K20 K to 675 Kwith PS-HTSTAGE option

Control stability

Sample stage temperature Helium stability Nitrogen stability
Base temperature (no heater control)±15 mK±20 mK
<10 K±50 mK
10 K to 100 K±20 mK±50 mK
101 K to 250 K±15 mK±50 mK
251 K to 350 K±15 mK±100 mK
351 K to 475 K±50 mK±100 mK
476 K to 675 K±50 mK±100 mK

Vacuum

 Standard TPS-FRG
Pump down time15 min
(to reach <1 × 10-3 Torr)
Room temperature<5 × 10-4 Torr
Helium base temperature<1 × 10-5 Torr
Maximum temperature<5 × 10-3 Torr

Cycle time (LHe):2 h
Vacuum pump down:15 min
Station cooldown:45 min
Station warmup:60 min

Vibration at sample

 Standard PS-TTVIS option
X axis<300 nm (11.8 µin)<30 nm (1.18 µin)
Y axis
Z axis

Sample 
Maximum sample size:51 mm (2 in) diameter
Sample backside optical access:5 mm (0.2 in) diameter
Sample rotation:Not an option

Probing configurations
Maximum probes:6
Probe arm sensor:Included for monitoring probe temperature
Cooled probe mounts:<35 K with sample at base temperature
Probe mount:Thermally anchored to sample stage
Probe arm:Thermally anchored to radiation shield
DC/RF probes and DC/RF flexible probes:Electrical isolation >100 GΩ for low leakage measurements
Microwave probes:Frequency range DC up to 67 GHz
Fiber optic probes:Available for electro-optical measurements
Probe landing:All probes can land at single point in a 25.4 mm (1.00 in) diameter circle

Cryogen consumption
Room to base temperature (total):3.5 liquid L helium; 2.5 liquid L nitrogen
Helium at 5 K:3 liquid L/h
Nitrogen at 80 K:<0.5 liquid L/h

Station details

Temperature equipment
Sample stage sensor/heater power:DT-670-CU-HT calibrated silicon diode/50 W
Radiation shield sensor/heater power:DT-670C-CU silicon diode/100 W
Probe arm:DT-670C-SD silicon diode (on one probe arm)/no active control
Temperature controller:Model 336
Helium transfer line:Helium/nitrogen transfer line with flow control, 12.7 mm (0.5 in) top port withdrawal
  
Included sample holder:Removable SH-1.25-G, 31.8 mm (1.25 in) maximum sample size, grounded
  
Station footprint:654 mm (25.8 in) width × 676 mm (26.6 in) depth
  
Vacuum chamber
Material:Electroless nickel-plated aluminum
Overall size:203 mm (8 in) outer diameter × 132 mm (5.2 in) tall
Chamber access:152 mm (6 in) diameter opening
Viewport:63.5 mm (2.50 in) diameter fused quartz
Viewing area:54.0 mm (2.13 in) diameter
Pump port:NW 25 with included vacuum isolation valve
Gauge port:Not an option
Gas port:0.25 in NPT with valve
Over pressure safety:3.5 kPa (0.5 psi) pressure relief valve
  
Radiation shielding
Material:Electroless nickel-plated aluminum
Sample access:122 mm (4.8 in) diameter lid
Viewport:50 mm (1.97 in) diameter IR absorbing window
Viewing area:50 mm (1.97 in) diameter
  
Vision system
  
Included kits
Tool kit:Included tools for standard operation
Spares kit:Included kit for common consumable items
Probe starter kit:ZN50R-25-W (qty 2), ZN50R-25-BECU (qty 2), and ZN50R-CVT-25-W (qty 2) for training
  
Utilities
1-phase voltage:100/120/220/240 VAC (+5%, -10%), 50/60 Hz
1-phase power: 1.7 kVA recommended
3-phase voltage:Not required
3-phase power:Not required
Cooling water:Not required
  
Approval:All instruments CE marked

Back to the TTPX overview

Probing configurations

Vision system