Cryogenic Probe Stations
| Model | Magnet field | Max probe arms | Standard temperature range | Optional high temperature | Optional low temperature | Max sample size | Vacuum | Sample stage rotation |
| Cryogen-free cryogenic probe stations | ||||||||
| CRX-EM-HF | 0.6 T horizontal field electromagnet | 4 | 8 K to 400 K | — | — | 25 mm (1 in) diameter | 10‑5 Torr | ±360° (optional) |
| CRX-VF | 2.5 T vertical field superconducting magnet | 6 | 10 K to 500 K, 10 K to 400 K with load-lock | — | — | 51 mm (2 in) diameter | 10‑5 Torr standard, 10‑7 Torr optional | — |
| Need Hall measurements? Get the CRX-VF with PS-HM-8425 Hall measurement package | ||||||||
| CRX-4K | — | 6 | 4.5 K to 350 K | 20 K to 675 K | — | 51 mm (2 in) diameter | 10‑5 Torr | — |
| CRX-6.5K | — | 6 | <10 K to 350 K | 20 K to 675 K | — | 51 mm (2 in) diameter | 10‑5 Torr | — |
| Cryogenic probe stations | ||||||||
| FWPX | — | 6 | 4.5 K to 475 K | — | 3.5 K | 102 mm (4 in) diameter | 10‑5 Torr | ±5° |
| EMPX-H2 | 0.6 T horizontal field electromagnet | 4 | 4.5 K to 400 K; 8 K to 400 K with 360° rotation option | — | 3.2 K | 25 mm (1 in) diameter | 10‑5 Torr | ±360° (optional) |
| CPX-VF | 2.5 T vertical field superconducting magnet | 6 | 4.2 K to 400 K, <10 K to 400 K with load-lock | — | 2 K | 51 mm (2 in) diameter | 10‑5 Torr standard, 10‑7 Torr optional | ±5° |
| CPX | — | 6 | 4.2 K to 475 K, <10 K to 400 K with load-lock | — | Low temp: 1.9 K very low temp: 1.6 K | 51 mm (2 in) diameter; 12.7 mm (0.5 in) with load-lock | 10‑5 Torr standard, 10‑7 Torr optional | ±5° |
| TTPX | — | 6 | 4.2 K to 475 K | 20 K to 675 K | 3.2 K | 51 mm (2 in) diameter | 10‑5 Torr | — |
| PS-100 | — | 4* | 4.2 K to 475 K | — | 3.2 K | 32 mm (1.25 in) diameter* | 10‑5 Torr | — |
*As currently configured. The PS-100 can be field upgraded to six probe arms and support larger sample sizes by selecting optional equipment from the TTPX probe station family. | ||||||||
Features of the Model PS-100 tabletop probe station
- Fully specified, preconfigured entry-level system
- Compact tabletop design with four-arm triaxial configuration
- Affordable, simple to order, rapidly shipped
- Just add cryogen and vacuum pump
- Can be field upgraded for other TTPX capabilities
Features of the Model TTPX Tabletop Probe Station
- Entry-level system
- Compact tabletop design
- Affordable
- Rapid cooldown and warmup
- Backside optical access
Features of the Model CPX High Performance Probe Station
- Lake Shore’s most versatile probe station
- Numerous options and configurations available
- Multiple radiation shields for best low temperature performance
- Minimize sample condensation during cool-down
- Customizable for sample transfer with no exposure to atmosphere
- Customizable to accommodate a 4 in wafer
Features of the Model CPX-VF Superconducting Magnet-based Vertical Field Probe Station
- Standard probing plus out-of-plane vertical field superconducting magnetic measurements
- Multiple radiation shields for best low temperature performance
- Minimize sample condensation during cool-down
- True 90° probing
- Customizable for Hall measurements
- Customizable up to 3 T with specialized probes
Features of the Model EMPX-H2 Electromagnet-based Horizontal Field Probe Station
- Standard probing plus in-plane horizontal field electromagnetic measurements
- Generate full field without cryogen or cooldown
- Probes configured at 30° angles to accommodate electromagnet
Features of the Model FWPX Large-size wafer probe station
- Largest wafer sample size: 4 in
- Sample translation for rapid probing
- Customizable to accept 6 in wafers
Features of the Model CRX-6.5K Affordable Cryogen-free Probe Station
- Cryogen-free operation
- Push-button operation and allows unsupervised cooldown
- Affordability
Features of the Model CRX-4K High Performance Closed Cycle Refrigerator-based Probe Station
- Cryogen-free operation
- Allows unsupervised cool down
- Low temperature operation
- Minimize sample condensation during cooldown
- Customizable to accommodate a 102 mm (4 in) wafer
Features of the Model CRX-VF Cryogen-free Vertical Field Superconducting Magnet Probe Station
- Cryogen-free operation
- Allows unsupervised cooldown
- Standard probing plus out-of-plane vertical field superconducting magnetic measurements
- True 90° probing
- Customizable up to 3 T with specialized probes
- Customizable to make Hall measurements
Easily add Hall measurement capabilities to your probe station
- A complete solution for enabling Hall measurements in a CRX-VF probe station
- Supports a range of DC Hall measurements on wafer-scale materials and structures as a function of temperature and field
- Includes all the instrumentation and software for facilitating Hall measurements
- Supports DC fields to 2 T and resistances from 0.5 mΩ to 100 GΩ
- Intuitive software provides easy system operation, data acquisition, and analysis
- Supports exporting of data for multi-carrier analysis
Features of the Model CRX-EM-HF Cryogen-free Horizontal Field Electromagnet Probe Station
- Cryogen-free operation
- Allows unsupervised cool down
- Standard probing plus in-plane horizontal field electromagnetic measurements
- Generate full field without cooldown
- Probes configured at 30° angles to accommodate electromagnet
- Optional 360° rotation
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Available custom probe stations
- Cryogen-free superconducting magnet probe station
- Large (8 in) wafer probing
- High voltage measurements up to 3 kV
- Room temperature vacuum probe station
- Miniature, transportable sample vacuum chamber
Probe station features by model
Lake Shore’s probe station family features many configuration options to cover the requirements of a broad range of applications. Use the table below to identify any specific features needed and the probe station models that best meet these needs.
Looking for other Lake Shore solutions? See our cryogenic temperature sensor, cryogenic temperature controller, and cryogenic temperature monitor pages.
What is a cryogenic probe station?
A cryogenic probe station enables non-destructive testing of materials or devices in a cryogen-refrigerated vacuum chamber, with electrically conducting probes used on wafer samples to measure material phenomena as a function of temperature (as well as magnetic field on some models).