lipix

Cryogenic probe stations

Download the probe station catalog
See more about our entry-level probe station
Upgrade your wet probe station to a CCR
ModelMagnet fieldMax probe armsStandard temperature rangeOptional high temperatureOptional low temperatureMax sample sizeVacuumSample stage rotation
Cryogen-free cryogenic probe stations
CRX-EM-HF0.6 T horizontal field electromagnet48 K to 420 K25 mm (1 in) diameter10‑5 Torr±360° (optional)
CRX-VF2.5 T vertical field superconducting magnet610 K to 420 K51 mm (2 in) diameter10‑5 Torr standard, 10‑7 Torr optional
Need Hall measurements? Get the CRX-VF with PS-HM-8425 Hall measurement package
CRX-4K64.5 K to 350 K20 K to 675 K51 mm (2 in) diameter10‑5 Torr
CRX-6.5K6<10 K to 350 K20 K to 675 K51 mm (2 in) diameter10‑5 Torr
Cryogenic probe stations
FWPX64.5 K to 420 K3.5 K102 mm (4 in) diameter10‑5 Torr±5°
EMPX-H20.6 T horizontal field electromagnet44.5 K to 420 K; 8 K to 420 K with 360° rotation option3.2 K25 mm (1 in) diameter10‑5 Torr±360° (optional)
CPX-VF2.5 T vertical field superconducting magnet64.2 K to 420 K, <10 K to 420 K with load-lock2 K51 mm (2 in) diameter10‑5 Torr standard, 10‑7 Torr optional±5°
CPX64.2 K to 420 K, <10 K to 420 K with load-lockLow temp: 1.9 K Very low temp: 1.6 K51 mm (2 in) diameter; 12.7 mm (0.5 in) with load-lock10‑5 Torr standard, 10‑7 Torr optional±5°
TTPX64.2 K to 420 K20 K to 675 K3.2 K51 mm (2 in) diameter10‑5 Torr
PS-1004*4.2 K to 420 K3.2 K32 mm (1.25 in) diameter*10‑5 Torr
Custom probe stations

*As currently configured. The PS-100 can be field upgraded to six probe arms and support larger sample sizes by selecting optional equipment from the TTPX probe station family.

Download the PDF version



PS-100 tabletop probe station features

  • Fully specified, preconfigured entry-level system
  • Compact tabletop design with four-arm triaxial configuration
  • Affordable, simple to order, rapidly shipped
  • Just add cryogen and vacuum pump
  • Can be field upgraded for other TTPX capabilities

TTPX tabletop probe station features

  • Entry-level system
  • Compact tabletop design
  • Affordable
  • Rapid cooldown and warmup
  • Backside optical access

CPX high-performance probe station features

  • Lake Shore’s most versatile probe station
  • Numerous options and configurations available
  • Multiple radiation shields for best low-temperature performance
  • Minimize sample condensation during cool-down
  • Customizable for sample transfer with no exposure to atmosphere
  • Customizable to accommodate a 4 in wafer

CPX-VF superconducting magnet-based vertical-field probe station features

  • Standard probing plus out-of-plane vertical field superconducting magnetic measurements
  • Multiple radiation shields for best low-temperature performance
  • Minimize sample condensation during cool-down
  • True 90° probing
  • Customizable for Hall measurements
  • Customizable up to 3 T with specialized probes

EMPX-H2 electromagnet-based horizontal-field probe station features

  • Standard probing plus in-plane horizontal field electromagnetic measurements
  • Generate full field without cryogen or cooldown
  • Probes configured at 30° angles to accommodate electromagnet

FWPX large-size wafer probe station features

  • Largest wafer sample size: 4 in
  • Sample translation for rapid probing
  • Customizable to accept 6 in wafers

CRX-6.5K affordable cryogen-free probe station features

  • Cryogen-free operation
  • Push-button operation and allows unsupervised cooldown
  • Affordability

CRX-4K high-performance cryogen-free probe station features

  • Cryogen-free operation
  • Allows unsupervised cooldown
  • Low-temperature operation
  • Minimize sample condensation during cooldown
  • Customizable to accommodate a 102 mm (4 in) wafer

CRX-VF cryogen-free vertical-field superconducting magnet probe station features

  • Cryogen-free operation
  • Allows unsupervised cooldown
  • Standard probing plus out-of-plane vertical field superconducting magnetic measurements
  • True 90° probing
  • Customizable up to 3 T with specialized probes
  • Customizable to make Hall measurements

Easily add Hall measurement capabilities to your probe station

  • A complete solution for enabling Hall measurements in a CRX-VF probe station
  • Supports a range of DC Hall measurements on wafer-scale materials and structures as a function of temperature and field
  • Includes all the instrumentation and software for facilitating Hall measurements
  • Supports DC fields to 2 T and resistances from 0.5 mΩ to 100 GΩ
  • Intuitive software provides easy system operation, data acquisition, and analysis
  • Supports exporting of data for multi-carrier analysis

CRX-EM-HF cryogen-free horizontal-field electromagnet probe station features

  • Cryogen-free operation
  • Allows unsupervised cooldown
  • Standard probing plus in-plane horizontal field electromagnetic measurements
  • Generate full field without cooldown
  • Probes configured at 30° angles to accommodate electromagnet
  • Optional 360° rotation

Available custom probe stations

  • Cryogen-free superconducting magnet probe station
  • Large (8 in) wafer probing
  • High voltage measurements up to 3 kV
  • Room temperature vacuum probe station
  • Miniature, transportable sample vacuum chamber

Probe station features by model

Lake Shore’s probe station family features many configuration options to cover the requirements of a broad range of applications. Use the table below to identify any specific features needed and the probe station models that best meet these needs.

Lake Shore probe station configurations


Lake Shore probe stations now integrate easily into Keysight B1500A analyzer applications


Rapidly characterize ferroelectric devices with a Lake Shore/Radiant Technologies test solution

 

Looking for other Lake Shore solutions? See our cryogenic temperature sensor, cryogenic temperature controller, and cryogenic temperature monitor pages.

 

What is a cryogenic probe station?

A cryogenic probe station enables non-destructive testing of materials or devices in a cryogen-refrigerated vacuum chamber, with electrically conducting probes used on wafer samples to measure material phenomena as a function of temperature (as well as magnetic field on some models).