CRX-6.5K Specifications

Sample cooling assembly

Type:2-stage (sample + radiation shield)
Radiation shielding:Radiation shield with top viewport surrounds sample
Cooling source:2-stage closed cycle refrigerator (CCR) with 3 W cooling power at 10 K
Magnetic field:Ring magnet kit


Base temperature Control range Configuration
8 K8.5 K to 350 K2 probe arms installed
9 K9.5 K to 350 K4 probe arms installed
10 K10.5 K to 350 K6 probe arms installed
20 K20 K to 675 Kwith PS-HTSTAGE option

1Base temperature assumes heat load for probes thermally anchored as listed in probing section

Control stability

Sample stage temperature Stability
Base temperature (no heater control)Not specified
<10 K±25 mK
11 K to 350 K±10 mK
351 K to 675 K±50 mK


Room temperature:<5 × 10-4 Torr
Base temperature:<1 × 10-5 Torr
Maximum temperature:<5 × 10-5 Torr

Cycle time:

6.25 h
Pump down:0.5 h
Station cooldown:3.5 h
Station warmup:2.25 h

Vibration at sample:

<2 µm


Maximum sample size:51 mm (2 in) diameter
Sample backside optical access:Not an option
Sample rotation:Not an option

Probing configurations

Maximum probes:6
Probe arm sensor:Included for monitoring probe temperature
Cooled probe mounts:<20 K with sample at base temperature
Probe mount:Thermally anchored to sample stage
Probe arm:Thermally anchored to radiation shield
DC/RF probes and DC/RF flexible probes:Electrical isolation >100 GΩ for low leakage measurements
Microwave probes:Frequency range DC up to 67 GHz for RF measurements
Fiber optic probes:Available for electro-optical measurements
Probe landing:All probes can land at single point in a 25.4 mm (1 in) diameter circle

Cryogen consumption

Room to base temperature (total):Not required
Helium at 5 K:Not required

Station details

Temperature equipment

Sample stage sensor/heater power:DT-670-CU-HT calibrated silicon diode/100 W
Radiation shield sensor/heater power:DT-670C-CU silicon diode/50 W
CCR 2nd stage sensor/heater power:DT-670A-CU silicon diode/50 W installed but not actively monitored
CCR 1st stage sensor/heater power:DT-670C-CU silicon diode/100 W
Probe arm:DT-670C-SD silicon diode (on one probe arm)/no active control
Temperature controller:Model 336
Helium transfer line:Not required

Included sample holder:

Removable SH-1.25-G, 31.8 mm (1.25 in) maximum sample size, grounded

Station footprint:

654 mm (25.8 in) width × 676 mm (26.6 in) depth
(does not include CCR compressor)

Vacuum chamber

Material:Electroless nickel-plated aluminum
Overall size:203 mm (8 in) outer diameter × 132 mm (5.2 in) tall
Chamber access:152 mm (6 in) diameter opening
Viewport:63.5 mm (2.50 in) diameter fused quartz
Viewing area:54.0 mm (2.13 in) diameter
Pump port:NW 25 with included vacuum isolation valve
Gauge port:NW 25
Gas port:0.25 in NPT with valve
Over pressure safety:3.5 kPa (0.5 psi) pressure relief valve

Radiation shielding

Material:Electroless nickel-plated aluminum
Sample access:132 mm (5.2 in) diameter lid
Viewport:50 mm (1.97 in) diameter IR absorbing window
Viewing area:50 mm (1.97 in) diameter

Vision system


Included kits

Tool kit:Included tools for standard operation
Spares kit:Included kit for common consumable items
Probe starter kit:ZN50R-25-W (qty 2), ZN50R-25-BECU (qty 2), and ZN50R-CVT-25-W (qty 2) for training


1-phase voltage:100/120/220/240 VAC (+5%, -10%), 50/60 Hz
1-phase power: 1.5 kVA recommended
1-phase voltage (CCR):208/230 V (+5%), 60 Hz or 200/230/240 (+5%), 50 Hz (2 pole, 3 wire single phase plus ground, 20 A)
1-phase power (CCR):3.0 kW, 15.5 A full load at 208 V, 60 Hz; 2.6 kW, 13 A full load at 200 V, 50 Hz
Cooling water power dissipation (CCR):3.2 kW 50/60 Hz — see list of available recirculating chillers


All instruments CE marked


Back to the CRX-6.5K overview

Probing configurations

Vision system

Recirculating chillers