CRX-4K Specifications

Sample cooling assembly

Type:2-stage (sample + radiation shield)
Radiation shielding:Radiation shield with top viewport surrounds sample
Cooling source:2-stage closed cycle refrigerator (CCR) with 1 W cooling power at 4.2 K
  
Magnetic field:Ring magnet kit

Temperature1

Base temperature Control range Configuration
4.5 K5 K to 350 K2 probe arms installed
5.5 K6 K to 350 K4 probe arms installed
6.0 K6.5 K to 350 K6 probe arms installed
20 K20 K to 675 Kwith PS-HTSTAGE option

1Base temperature assumes heat load for probes thermally anchored as listed in probing section

Control stability

Sample stage temperature Stability
Base temperature (no heater control)Not specified
<10 K±50 mK
10 K to 100 K±10 mK
101 K to 250 K±10 mK
251 K to 350 K±20 mK
351 K to 675 K±50 mK

 Standard TPS-FRG
Pump down time30 min (to reach <1 × 10-3 Torr)
Room temperature<5 × 10-4 Torr
Base temperature<1 × 10-5 Torr
Maximum temperature<1 × 10-5 Torr

Cycle time:4 h
Pump down:0.5 h
Station cooldown:2 h
Station warmup:1.5 h

Vibration at sample:<1 µm

Sample 
Maximum sample size:51 mm (2 in) diameter
Sample backside optical access:Not an option
Sample rotation:Not an option

Probing configurations 
Maximum probes:6
Probe arm sensor:Included for monitoring probe temperature
Cooled probe mounts:<20 K with sample at base temperature
Probe mount:Thermally anchored to sample stage
Probe arm:Thermally anchored to radiation shield
DC/RF probes and DC/RF flexible probes:Electrical isolation >100 GΩ for low leakage measurements
Microwave probes:Frequency range DC up to 67 GHz for RF measurements
Fiber optic probes:Available for electro-optical measurements
Probe landing:All probes can land at single point in a 25.4 mm (1 in) diameter circle

Cryogen consumption
Room to base temperature (total):Not required
Helium at 5 K:Not required

Station details

Temperature equipment
Sample stage sensor/heater power:DT-670-CU-HT calibrated silicon diode/100 W
Radiation shield sensor/heater power:DT-670C-CU silicon diode/50 W
CCR 2nd stage sensor/heater power:DT-670A-CU silicon diode/50 W installed but not actively monitored
CCR 1st stage sensor/heater power:DT-670C-CU silicon diode/100 W
Probe arm:DT-670C-SD silicon diode (on one probe arm)/ no active control
Electronics console::
Temperature controllers:Two Model 336s
Helium transfer line:Not required
  
Included sample holder:Removable SH-1.25-G, 31.8 mm (1.25 in) maximum sample size, grounded
  
Station footprint:800 mm (31.5 in) width × 670 mm (26.4 in) depth
(does not include console or CCR compressor)
  
Vacuum chamber
Material:Electroless nickel-plated aluminum
Overall size:280 mm (11 in) outer diameter × 140 mm (5.5 in) tall
Chamber access:229 mm (9 in) diameter opening
Viewport:63.5 mm (2.50 in) diameter fused quartz
Viewing area:54.0 mm (2.13 in) diameter
Pump port:NW 40 with included vacuum isolation valve
Gauge port:NW 25
Gas port:0.25 in NPT with valve
Over pressure safety:3.5 kPa (0.5 psi) pressure relief valve
  
Radiation shielding
Material:Electroless nickel-plated aluminum
Sample access:132 mm (5.2 in) diameter lid
Viewport:50 mm (1.97 in) diameter IR absorbing window
Viewing area:50 mm (1.97 in) diameter
  
Vision system
  
Included kits
Tool kit:Included tools for standard operation
Spares kit:Included kit for common consumable items
Probe starter kit:ZN50R-25-W (qty 2), ZN50R-25-BECU (qty 2), and
ZN50R-CVT-25-W (qty 2) for training
  
Utilities
1-phase voltage:100/120/220/240 VAC (+5%, -10%), 50/60 Hz
1-phase power: 2 kVA recommended
3-phase voltage (CCR):200 VAC (50/60 Hz) or 380/400/415 VAC 50 Hz or 480 VAC 60 Hz
3-phase power (CCR):6.6 to 6.9 kW at 50 Hz; 7.5 to 7.8 kW at 60 Hz
Cooling water power dissipation (CCR):8.5 kW max; 6.9 kW steady state at 50 Hz; 9.0 kW max; 7.8 kW steady state at 60 Hz — see list of available recirculating chillers
  
Approval:All instruments CE marked

Back to the CRX-4K overview

Probing configurations

Vision system

Recirculating chillers