CRX-4K Specifications

Sample cooling assembly

Type:2-stage (sample + radiation shield)
Radiation shielding:Radiation shield with top viewport surrounds sample
Cooling source:2-stage closed cycle refrigerator (CCR) with 1 W cooling power at 4.2 K

Magnetic field:

Ring magnet kit


Base temperature Control range Configuration
4.5 K5 K to 350 K2 probe arms installed
5.5 K6 K to 350 K4 probe arms installed
6.0 K6.5 K to 350 K6 probe arms installed
20 K20 K to 675 Kwith PS-HTSTAGE option (not compatible with backside biasing of the sample)

1Base temperature assumes heat load for probes thermally anchored as listed in probing section

Control stability

Sample stage temperature Stability
Base temperature (no heater control)Not specified
<10 K±50 mK
10 K to 100 K±10 mK
101 K to 250 K±10 mK
251 K to 350 K±20 mK
351 K to 675 K±50 mK

 Standard TPS-FRG
Pump down time30 min (to reach <1 × 10-3 Torr)
Room temperature<5 × 10-4 Torr
Base temperature<1 × 10-5 Torr
Maximum temperature<1 × 10-5 Torr

Cycle time:

4 h
Pump down:0.5 h
Station cooldown:2 h
Station warmup:1.5 h

Vibration at sample:

<1 µm


Maximum sample size:51 mm (2 in) diameter
Sample backside optical access:Not an option
Sample rotation:Not an option

Probing configurations

Maximum probes:6
Probe arm sensor:Included for monitoring probe temperature
Cooled probe mounts:<20 K with sample at base temperature
Probe mount:Thermally anchored to sample stage
Probe arm:Thermally anchored to radiation shield
DC/RF probes and DC/RF flexible probes:Electrical isolation >100 GΩ for low leakage measurements
Microwave probes:Frequency range DC up to 67 GHz for RF measurements
Fiber optic probes:Available for electro-optical measurements
Probe landing:All probes can land at single point in a 25.4 mm (1 in) diameter circle

Cryogen consumption

Room to base temperature (total):Not required
Helium at 5 K:Not required

Station details

Temperature equipment

Sample stage sensor/heater power:DT-670-CU-HT calibrated silicon diode/100 W
Radiation shield sensor/heater power:DT-670C-CU silicon diode/50 W
CCR 2nd stage sensor/heater power:DT-670A-CU silicon diode/50 W installed but not actively monitored
CCR 1st stage sensor/heater power:DT-670C-CU silicon diode/100 W
Probe arm:DT-670C-SD silicon diode (on one probe arm)/ no active control
Electronics console::
Temperature controllers:Two Model 336s
Helium transfer line:Not required

Included sample holder:

Removable SH-1.25-G, 31.8 mm (1.25 in) maximum sample size, grounded

Station footprint:

800 mm (31.5 in) width × 670 mm (26.4 in) depth (does not include console or CCR compressor)

Vacuum chamber

Material:Electroless nickel-plated aluminum
Overall size:280 mm (11 in) outer diameter × 140 mm (5.5 in) tall
Chamber access:229 mm (9 in) diameter opening
Viewport:63.5 mm (2.50 in) diameter fused quartz
Viewing area:54.0 mm (2.13 in) diameter
Pump port:NW 40 with included vacuum isolation valve
Gauge port:NW 25
Gas port:0.25 in NPT with valve
Over-pressure safety:3.5 kPa (0.5 psi) pressure relief valve

Radiation shielding

Material:Electroless nickel-plated aluminum
Sample access:132 mm (5.2 in) diameter lid
Viewport:50 mm (1.97 in) diameter IR absorbing window
Viewing area:50 mm (1.97 in) diameter

Vision system


Included kits

Tool kit:Included tools for standard operation
Spares kit:Included kit for common consumable items
Probe starter kit:ZN50R-25-W (qty 2), ZN50R-25-BECU (qty 2), and ZN50R-CVT-25-W (qty 2) for training


1-phase voltage:100/120/220/240 VAC (+5%, -10%), 50/60 Hz
1-phase power: 2 kVA recommended
3-phase voltage (CCR):200 VAC (50/60 Hz) or 380/400/415 VAC 50 Hz or 480 VAC 60 Hz
3-phase power (CCR):6.6 to 6.9 kW at 50 Hz; 7.5 to 7.8 kW at 60 Hz
Cooling water power dissipation (CCR):8.5 kW max; 6.9 kW steady state at 50 Hz; 9.0 kW max; 7.8 kW steady state at 60 Hz — see list of available recirculating chillers


All instruments CE marked


Back to the CRX-4K overview

Probing configurations

Vision system

Recirculating chillers