CRX-4K Specifications

Sample cooling assembly

Type: 2-stage (sample + radiation shield)
Radiation shielding: Radiation shield with top viewport surrounds sample
Cooling source: 2-stage closed cycle refrigerator (CCR) with 1 W cooling power at 4.2 K
   

Magnetic field:

Ring magnet kit

Temperature1

Base temperature Control range Configuration
4.5 K 5 K to 350 K 2 probe arms installed
5.5 K 6 K to 350 K 4 probe arms installed
6.0 K 6.5 K to 350 K 6 probe arms installed
20 K 20 K to 675 K with PS-HTSTAGE option

1Base temperature assumes heat load for probes thermally anchored as listed in probing section

Control stability

Sample stage temperature Stability
Base temperature (no heater control) Not specified
<10 K ±50 mK
10 K to 100 K ±10 mK
101 K to 250 K ±10 mK
251 K to 350 K ±20 mK
351 K to 675 K ±50 mK

  Standard TPS-FRG
Pump down time 30 min (to reach <1 × 10-3 Torr)
Room temperature <5 × 10-4 Torr
Base temperature <1 × 10-5 Torr
Maximum temperature <1 × 10-5 Torr

Cycle time:

4 h
Pump down: 0.5 h
Station cooldown: 2 h
Station warmup: 1.5 h

Vibration at sample:

<1 µm

Sample

 
Maximum sample size: 51 mm (2 in) diameter
Sample backside optical access: Not an option
Sample rotation: Not an option

Probing configurations

 
Maximum probes: 6
Probe arm sensor: Included for monitoring probe temperature
Cooled probe mounts: <20 K with sample at base temperature
Probe mount: Thermally anchored to sample stage
Probe arm: Thermally anchored to radiation shield
DC/RF probes and DC/RF flexible probes: Electrical isolation >100 GΩ for low leakage measurements
Microwave probes: Frequency range DC up to 67 GHz for RF measurements
Fiber optic probes: Available for electro-optical measurements
Probe landing: All probes can land at single point in a 25.4 mm (1 in) diameter circle

Cryogen consumption

Room to base temperature (total): Not required
Helium at 5 K: Not required

Station details

Temperature equipment

Sample stage sensor/heater power: DT-670-CU-HT calibrated silicon diode/100 W
Radiation shield sensor/heater power: DT-670C-CU silicon diode/50 W
CCR 2nd stage sensor/heater power: DT-670A-CU silicon diode/50 W installed but not actively monitored
CCR 1st stage sensor/heater power: DT-670C-CU silicon diode/100 W
Probe arm: DT-670C-SD silicon diode (on one probe arm)/ no active control
Electronics console::
Temperature controllers: Two Model 336s
Helium transfer line: Not required
   

Included sample holder:

Removable SH-1.25-G, 31.8 mm (1.25 in) maximum sample size, grounded
   

Station footprint:

800 mm (31.5 in) width × 670 mm (26.4 in) depth (does not include console or CCR compressor)
   

Vacuum chamber

Material: Electroless nickel-plated aluminum
Overall size: 280 mm (11 in) outer diameter × 140 mm (5.5 in) tall
Chamber access: 229 mm (9 in) diameter opening
Viewport: 63.5 mm (2.50 in) diameter fused quartz
Viewing area: 54.0 mm (2.13 in) diameter
Pump port: NW 40 with included vacuum isolation valve
Gauge port: NW 25
Gas port: 0.25 in NPT with valve
Over pressure safety: 3.5 kPa (0.5 psi) pressure relief valve
   

Radiation shielding

Material: Electroless nickel-plated aluminum
Sample access: 132 mm (5.2 in) diameter lid
Viewport: 50 mm (1.97 in) diameter IR absorbing window
Viewing area: 50 mm (1.97 in) diameter
   

Vision system

   

Included kits

Tool kit: Included tools for standard operation
Spares kit: Included kit for common consumable items
Probe starter kit: ZN50R-25-W (qty 2), ZN50R-25-BECU (qty 2), and ZN50R-CVT-25-W (qty 2) for training
   

Utilities

1-phase voltage: 100/120/220/240 VAC (+5%, -10%), 50/60 Hz
1-phase power: 2 kVA recommended
3-phase voltage (CCR): 200 VAC (50/60 Hz) or 380/400/415 VAC 50 Hz or 480 VAC 60 Hz
3-phase power (CCR): 6.6 to 6.9 kW at 50 Hz; 7.5 to 7.8 kW at 60 Hz
Cooling water power dissipation (CCR): 8.5 kW max; 6.9 kW steady state at 50 Hz; 9.0 kW max; 7.8 kW steady state at 60 Hz — see list of available recirculating chillers
   

 

Back to the CRX-4K overview

Probing configurations

Vision system

Recirculating chillers