Home > Products > Material characterization products > Cryogenic Probe Stations > Model CRX-4K Cryogenic Probe Station/technical-specifications

CRX-4K Specifications

Sample cooling assembly

Type:	2-stage (sample + radiation shield)
Radiation shielding:	Radiation shield with top viewport surrounds sample
Cooling source:	2-stage closed cycle refrigerator (CCR) with 1 W cooling power at 4.2 K

Magnetic field:	Ring magnet kit

Temperature¹

Base temperature	Control range	Configuration
4.5 K	5 K to 350 K	2 probe arms installed
5.5 K	6 K to 350 K	4 probe arms installed
6.0 K	6.5 K to 350 K	6 probe arms installed
20 K	20 K to 675 K	with PS-HTSTAGE option

¹Base temperature assumes heat load for probes thermally anchored as listed in probing section

Control stability

Sample stage temperature	Stability
Base temperature (no heater control)	Not specified
<10 K	±50 mK
10 K to 100 K	±10 mK
101 K to 250 K	±10 mK
251 K to 350 K	±20 mK
351 K to 675 K	±50 mK

	Standard TPS-FRG
Pump down time	30 min (to reach <1 × 10^-3 Torr)
Room temperature	<5 × 10^-4 Torr
Base temperature	<1 × 10^-5 Torr
Maximum temperature	<1 × 10^-5 Torr

Cycle time:	4 h
Pump down:	0.5 h
Station cooldown:	2 h
Station warmup:	1.5 h

Vibration at sample:

<1 µm

Sample
Maximum sample size:	51 mm (2 in) diameter
Sample backside optical access:	Not an option
Sample rotation:	Not an option

Probing configurations
Maximum probes:	6
Probe arm sensor:	Included for monitoring probe temperature
Cooled probe mounts:	<20 K with sample at base temperature
Probe mount:	Thermally anchored to sample stage
Probe arm:	Thermally anchored to radiation shield
DC/RF probes and DC/RF flexible probes:	Electrical isolation >100 GΩ for low leakage measurements
Microwave probes:	Frequency range DC up to 67 GHz for RF measurements
Fiber optic probes:	Available for electro-optical measurements
Probe landing:	All probes can land at single point in a 25.4 mm (1 in) diameter circle

Cryogen consumption
Room to base temperature (total):	Not required
Helium at 5 K:	Not required

Station details

Temperature equipment
Sample stage sensor/heater power:	DT-670-CU-HT calibrated silicon diode/100 W
Radiation shield sensor/heater power:	DT-670C-CU silicon diode/50 W
CCR 2nd stage sensor/heater power:	DT-670A-CU silicon diode/50 W installed but not actively monitored
CCR 1st stage sensor/heater power:	DT-670C-CU silicon diode/100 W
Probe arm:	DT-670C-SD silicon diode (on one probe arm)/ no active control
Electronics console::
Temperature controllers:	Two Model 336s
Helium transfer line:	Not required

Included sample holder:	Removable SH-1.25-G, 31.8 mm (1.25 in) maximum sample size, grounded

Station footprint:	800 mm (31.5 in) width × 670 mm (26.4 in) depth (does not include console or CCR compressor)

Vacuum chamber
Material:	Electroless nickel-plated aluminum
Overall size:	280 mm (11 in) outer diameter × 140 mm (5.5 in) tall
Chamber access:	229 mm (9 in) diameter opening
Viewport:	63.5 mm (2.50 in) diameter fused quartz
Viewing area:	54.0 mm (2.13 in) diameter
Pump port:	NW 40 with included vacuum isolation valve
Gauge port:	NW 25
Gas port:	0.25 in NPT with valve
Over pressure safety:	3.5 kPa (0.5 psi) pressure relief valve

Radiation shielding
Material:	Electroless nickel-plated aluminum
Sample access:	132 mm (5.2 in) diameter lid
Viewport:	50 mm (1.97 in) diameter IR absorbing window
Viewing area:	50 mm (1.97 in) diameter

Vision system

Included kits
Tool kit:	Included tools for standard operation
Spares kit:	Included kit for common consumable items
Probe starter kit:	ZN50R-25-W (qty 2), ZN50R-25-BECU (qty 2), and ZN50R-CVT-25-W (qty 2) for training

Utilities
1-phase voltage:	100/120/220/240 VAC (+5%, -10%), 50/60 Hz
1-phase power:	2 kVA recommended
3-phase voltage (CCR):	200 VAC (50/60 Hz) or 380/400/415 VAC 50 Hz or 480 VAC 60 Hz
3-phase power (CCR):	6.6 to 6.9 kW at 50 Hz; 7.5 to 7.8 kW at 60 Hz
Cooling water power dissipation (CCR):	8.5 kW max; 6.9 kW steady state at 50 Hz; 9.0 kW max; 7.8 kW steady state at 60 Hz — see list of available recirculating chillers