Probe configuration options
Customize your probe using the range of available options to match your application.
2Dex™ sensors are currently the only sensor types currently available with FP Series probes. These are the first probes to feature 2Dex sensors which offer a great balance of sensitivity, linearity, stability and ruggedness. These sensors set the new standard for the majority of field measurement applications.
Hall sensors are inherently directional, so the anticipated field direction will guide the selection of probe orientation.
Multiple sensors are placed to measure three orthogonal field vectors, allowing the measurement of both the overall field value and direction. This is particularly useful in several scenarios:
- Complex fields where the field direction is not known or changing over time
- Quick handheld measurements
- Field mapping of a volume
The three individual sensors don’t occupy the exact same location, meaning the three separate measurements are for slightly different positions in space. This results in the specification of an active volume, as opposed to an active area for single-axis probe variants. These probes can be identified by their square stem cross-section.
3-axis probes are only available with a standard stem up to 30 cm in length.
The sensor is positioned to measure fields running perpendicularly through the probe stem. This is most useful for measuring fields inside magnet gaps. These probes are easily identified by their flattened rectangular stem.
The sensor is placed very near to the tip of the probe and aligned to measure fields normal to the tip of the probe. This orientation is necessary when measuring inside solenoids, and can be useful for measuring fields at magnet poles due to the increased ease of alignment and fine adjustment.
Axial probes are not offered with a flexible-thin stem.
The sensor/s are housed in stem types suited for various applications. Where possible, active area locations are marked on the stems.
The general-purpose stem options offer an excellent balance of size and strength. Constructed from extruded and precision machined aluminum, these stems will be the superior choice in most situations.
This stem type is currently only available as a transverse orientation option at a fixed stem length. The surrounding aluminum stem of the standard probe is removed, exposing the PCB and sensor element. This results in a somewhat flexible stem that is also thinner than the standard offering, making it the best probe for measuring in very thin magnet gaps. It is possible to snap the PCB stem of this probe with excessive bending, so this should be minimized to prolong the life of the probe.
This stem also features a helpful ruler printed directly on the PCB. Useful in determining just how far the probe has been inserted into the magnet gap.
Ultra-low temperature applications require a more drastic overhaul of the probe stem:
- Non-magnetic stainless-steel alloy minimizes heat leak, while providing strength
- Greater stem lengths offered as standard to reach into the cryogenic environment
- Vented at the tip to allow cryogens to escape safely
- Cryogenic 2Dex™ sensors used in place of standard solution
Due to the increased sensor size used in these probes, 3-axis probes with very small active volumes are not possible. Contact us if you have an application that requires multi-axis cryogenic measurements to discuss options.
|05||5 cm (2 in)|
|15||15 cm (6 in)|
|30||30 cm (12 in)|
|150||150 cm (60 in)|
Stem lengthFP Series probes come in various lengths to suit your application.
|5 cm (~2 in)||15 cm (~6 in)||30 cm (~12 in)||150 cm (~60 in)|
If your application requires a non-standard stem solution, please contact us to discuss options.
Special handle (optional)
Special handle (optional)
Both handle options include polarity indicators when ordered with a transverse orientation, making it easy to quickly determine whether a magnet polarity has been switched, or if the probe is just being held incorrectly.
The default handle configuration is deigned to be a comfortable and functional handheld solution with an anodized aluminum grip for a solid and long-lasting grip surface.
In situations where probe fixturing is required to achieve repeatable measurements, the mountable form factor features a flat machined aluminum surface. It also includes locating pinholes for precise probe alignment and is easily held in place with just two screws.
Publicly available drawings and CAD models for this handle will make integration with your hardware quick and easy while minimizing the risk of a design error. These handles are available with standard and flexible stem choices.
Cryogenic probes are not available with a mountable stem.