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8400 Series HMS/downloads
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Application Notes
Anomalous Hall Effect Magnetometry Studies of Magnetization Processes of Thin Films
An Introduction to AC Field Hall Effect Measurements
Low Resistance Hall Measurements of Metals
Measurement the Magnetic Properties of Double Layered Perpendicular Magnetic Recording Media Using an Anomalous Hall Effect Magnetometer
Independent Measurement of Magnetic Properties of Double Layer Perpendicular Magnetic Recording Media Using an Anomalous Hall Effect Magnetometer
Characterizing Multi-Carrier Devices with Quantitative Mobility Spectrum Analysis And Variable Field Hall Measurements
Compound Semiconductors: Electronic Transport Characterization of HEMT Structures
Evaluation of Transport Properties using Quantitive Mobility Spectrum Analysis
Anomalous Hall Effect Magnetometry - A Method for Studying Magnetic Processes of Thin Magnetic Films
Characterization of Multi-Carrier Heterostructre Devices With Quantitative Mobility Spectrum Analysis And Variable Field Hall Measurements
Extraction of Low Mobility, Low Conductivity Carriers from Field Dependent Hall Data
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8400 Series Catalog (A4)
Model 8425 HMS and Probe Station (.pdf-1.5 MB)
PS-HM-8425 Hall Measurement Package for the CRX-VF Probe Station
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Hall mobility measurement of solar cell material
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