The M81-SSM is purpose-built for the demands of materials characterization, where sensitivity, synchronization, and low noise aren't optional.

KEY CAPABILITIES FOR MATERIALS RESEARCH:

orange-check-markLock-in detection to nanovolt sensitivity
orange-check-mark<0.0001° RMS phase noise across channels
orange-check-mark375 kSa/s synchronized sampling
orange-check-markCombined DC + AC measurements from a single unified system
orange-check-markEliminates ground loops, timing errors, and inter-instrument noise compounding
orange-check-markConfigurable for transport, Hall, impedance, and low-level I-V measurements

Materials research demands the most sensitive electrical measurements possible. Detecting transport properties in novel semiconductors, characterizing magnetic materials, measuring resistance through phase transitions—these measurements push instruments to their limits.

For decades, the lock-in amplifier has been the cornerstone of sensitive materials measurement. But modern research demands more: simultaneous DC and AC measurements, synchronized multi-parameter data, and noise floors low enough to resolve signals in the most challenging samples.

Traditional approaches mean assembling instruments from different vendors, each with its own clock, ground reference, and noise signature. Ground loops. Timing errors. Compounded noise. Never designed to work together.
The M81‑SSM is.

The M81's lock-in rivals the best standalone instruments (<0.0001° RMS phase noise, >120 dB dynamic reserve) pulling signals from noise that would overwhelm conventional setups. Purpose-built modules, synchronized through a common timebase and unified noise architecture. Designed and optimized for measurements that separate instruments can't deliver.

Beyond the Lock-in

M81-SSM synchronous source measure system

The M81-SSM doesn’t just replace your instrument rack. It outperforms it, because it was designed as one integrated source/measure system.
DC voltage source100 nV to 10 V, low noise (350 nV RMS)
AC voltage source100 µHz to 100 kHz, low noise (40 nV/√Hz at 1 kHz)
DC current source10 nA to 100 mA, 150 fA RMS (750 fA peak-to-peak)
AC current source100 µHz to 100 kHz, 20 fA/√Hz at 10 Hz
Precision voltmeterCombined AC lock-in with DC component, <10 fA sensitivity
Precision ammeterCombined AC lock-in with DC component, <100 fA sensitivity
Lock-in amplifier<0.0001° RMS phase noise, >120 dB dynamic reserve

PURPOSE-BUILT MODULES FOR ULTRA-LOW NOISE AND SENSITIVITY, READY FOR THE MOST DEMANDING SAMPLES

The VS-10 provides programmable voltage from ±1 V to ±10 V with a maximum of 100 mHz compliance, up to 100 kHz. Purpose-built for gate-biasing, voltage-sweep I-V curves, and applications requiring highly stable voltages in combination with current, resistance, conductance, and other material or device measurements.

  • 100 nV to 10 V, low noise (350 nV RMS)
  • Patented dual AC+DC range for seamless sourcing

The BCS-10 provides programmable currents from 1 pA to 100 mA with a maximum of 30 V compliance, up to 100 kHz. Its design reduces noise and improves common-mode rejection — delivering source noise performance that significantly improves measurement quality in sensitive applications.

  • 10 nA to 100 mA, 150 fA RMS (750 fA peak-to-peak)
  • DC to 100 kHz with or without AC modulation

The VM-10 provides voltage measurements with resolution from nanovolts to millivolts, with combined AC lock-in and DC measurement capabilities. Particularly useful for applications requiring numerous range changes including amplitude, phase, and harmonic detection.

  • Combined AC lock-in with DC component
  • <10 fA sensitivity
  • Configurable next to or remote from the M81 instrument for minimum environmental noise pickup

The CM-10 provides current measurements with near-zero input offset voltage from nanoamps to 100 nA, including amplitude, phase, and harmonic detection capabilities. Can be paired with the VM-10 for combined voltage and current measurements.

  • Combined AC lock-in with DC component
  • <100 fA sensitivity
  • Programmable ±1 V voltage bias offset for applications requiring biased current measurements