The Lake Shore Blog

In this new app note, we explore the use of a Lake Shore CRX-4K cryogenic probe station equipped with our new parametric probes and a high-temperature stage for making wafer-level capacitance-voltage (C-V) and capacitance-frequency (C-F) measurements at variable temperatures up to 600 K.

If you are interested in seeing typical measurement results for our award-winning 8600 Series VSM, download our new plot book, which includes results for various thin films, including 20 µemu CoPt bit-patterned magnetic media and perpendicular magnetic anisotropy thin films, and other samples.

Hall mobility measurements for p-type TCO research are explored in a new paper detailing the work of University of Texas at Dallas and University of Washington scientists developing low-cost optoelectronic products; the research involved using a Lake Shore Model 8404 Hall system to measure transport properties.

Application note on the use of new parametric probes for more accurate, wafer-level C-V (capacitance-voltage) measurements performed in cryogenic probe stations

This three-part Q&A features insights from three employees who played key roles in the design of the new MeasureReady™ 155 precision I/V source.

More material researchers are exploring FORC measurements. This paper is part of a rising trend of FORC-related scientific papers published since 2007.

This three-part Q&A features insights from three employees who played key roles in the design of the new MeasureReady™ 155 precision I/V source.

Holiday greetings from Lake Shore

In this video demo Brad Dodrill shows the ease of operation and speed of the 8600 Series VSM and demonstrates magnetometer hysteresis loop and FORC measurements

New paper by CEA Saclay Irfu provides overview of support hardware and software that can be used for particle accelerator, including Cernox and platinum sensors

New first-look video examines MeasureReady 155 I/V source for low-noise measurement, which is ideal for performing I-V curve and other material measurements

When you add instrumentation to your device under test, it becomes part of the circuit. The wrong circuit setup can cause unintended measurement problems.

Researchers have developed a novel RF bolometer using a CNT thin film as the thermistor element using the Lake Shore CPX-VF probe station.

Proper cable selection and shielding can help prevent magnetic interference in electronic device measurement, thus preventing noise.

When evaluating a laboratory measurement with multiple instruments, ground loops are common. Follow these tips to troubleshoot ground loop noise in a circuit.

New dual-connector parametric probes that make it easier to perform capacitance-voltage (C-V) and four-point measurements in Lake Shore cryogenic probe stations

The right current/voltage source setup can help prevent AC leakage current when performing electrical characterization measurements.

The Cassini probe with its Lake Shore sensors will plunge downward on September 15 and become a meteor, burning up through Saturn’s thick atmosphere.

New paper published in MRS Advances on use of high-temperature first order reversal curves (FORCs) for magnetic nanocomposite material characterization research

An instrument proven to be low noise can help reduce I-V measurement error and save time when characterizing electronic devices; download the free whitepaper.