Lake Shore Cryotronics will be at next week’s APS March Meeting in Chicago exhibiting a range of high-performance solutions for experimental physicists, including its new MeasureReady™ M81-SSM synchronous source measure system for low-level measurements in electronic material characterization applications.

The unique, modular system provides highly synchronized DC, 100 kHz AC, and mixed DC + AC sourcing and measuring – including both voltage and current lock-in measurement capabilities – for researchers exploring the electrical properties of early-stage devices. The multichannel system provides a simple way to characterize multiple samples in parallel under identical test conditions so researchers obtain consistent, comparable data much faster than having to test samples individually. 

Also, owing to its modular architecture, the M81-SSM allows signal and source amplifiers to be located as close as possible to the samples being characterized. By having both DC and AC sourcing and measurement in one instrument, the M81-SSM can often eliminate the need for mixed-instrument setups, greatly simplifying the setup and operation of complex characterization configurations.

In Booth 700 at the APS March Meeting, Lake Shore will specifically be demonstrating the M81-SSM instrument and its modules set up to measure small photocurrents of a diode mounted in a Lake Shore VNF-100 cryostat, with the company’s Model 335 cryogenic controller used to control sample chamber temperature and MeasureLINK™ software managing the experiment.