Lake Shore Cryotronics will be at next week’s Magnetism and Magnetic Materials (MMM) conference in Las Vegas, NV, to answer questions about the award-winning, electromagnet-based 8600 Series VSM for high-performance magnetic material characterization.
Representatives will be on-hand to discuss the benefits of the magnetometer system for characterizing samples over a wide (4.2 to 1273 K) temperature range and at fields to 3.26 T, and how it raises the bar for VSM performance in terms of moment sensitivity (<15 nemu) and field programming resolution (1 mOe) across the entire field range of operation.
The 8600 Series VSM especially benefits research involving first order reversal curve (FORC) measurements, flying through complex FORC data collection sequences in a fraction of the time required on previous systems. In addition, it is ideal for the study of low-moment materials (ultra-thin magnetic multilayers, nanoscale magnetic materials, dilute magnetic semiconductors, and paleomagnets, for example).
Plus, it offers convenient operation, enabling researchers to perform more science in less time. In particular, the system features an ergonomic design that simplifies user interaction with the system and ensures repeatable measurements. And its software simplifies VSM control and combines standard predefined measurement routines with configurable field and measurement loops to provide a flexible data acquisition environment.
Also at the MMM exhibit, attendees can learn about Lake Shore’s:
- MeasureReady™ MCS-EMP modular characterization systems – multi-purpose electromagnet platforms that provide all the components needed for automated, variable field experiments
- Magnetic test and measurement instruments, including F71/F41 teslameters for convenient, dependable field measurements (a demo unit with Hall probes will be on display in the booth)
- Hall sensors, including the company’s new 2Dex™ sensors for reliable magnetic field measurement
- Cryogenic probe stations with integrated in-plane and out-of-plane magnets for DC, RF, and microwave probing of material samples in fields to more than 2 T and at temperatures below 4 K.