Lake Shore Cryotronics will be at next week’s International Microwave Symposium (IMS) in Boston to discuss cryogenic probe stations that enable the characterization of high-frequency devices at temperatures as low as 2 K.
Cryogenic probe stations benefit early-stage research requiring fundamental I-V, C-V, and other electrical measurements of test structures, including those for MMIC, LNA, or MEMS designs. In these applications, there is often a need for non-destructive RF/microwave measurements
as a function of low temperature as well as magnetic field within a controlled environment. Lake Shore probe stations provide this level of control, and they can be configured for RF probing up to 1 GHz and/or GSG RF/microwave probing up to 40
or 67 GHz.
Various configurations are available, including models for cryogen-free or liquid cryogen operation, and an affordable tabletop model for probing devices on full and partial wafers up to 51 mm (2 in) in diameter. This version, the Model TTPX, will be on display in Lake Shore’s booth (#726) at IMS.
Also on display will be Lake Shore’s cryogenic THz probe arm option for probe stations. This contact-probing solution, designed for on-wafer probing of millimeter wave (MMW) devices at 75 to 110 GHz and 140 to 220 GHz frequencies, enables calibrated S-parameter and other high-frequency measurements at cryogenic temperatures. These measurements offer specific value to researchers developing next-generation technologies, such as new THz detectors, and radio astronomy and 5G wireless components.