​8600 Series VSM to be focus of Lake Shore exhibit at Joint MMM-Intermag conference
Lake Shore Cryotronics will be at next week’s Joint MMM-Intermag conference in Washington, D.C., to discuss their award-winning 8600 Series VSM and new solutions for magnetic material characterization and field measurement and control.
MMM-Intermag 2018
The electromagnet-based 8600 Series, the company’s latest in specialized systems for magnetic material research, raises the bar for magnetometer performance and convenience. It combines high sensitivity (15 nemu), rapid measurement speed (10 ms/pt), and simple operation in a system that enables researchers to perform more science in less time.
Featuring an ergonomic design that simplifies user interaction with the system and ensures repeatable measurements, the 8600 Series can be used to characterize properties of samples over a 4.2 K to 1273 K temperature range and at variable fields to 3.26 T. The system especially benefits research involving first order reversal curve (FORC) measurements, flying through complex FORC data collection sequences in a fraction of the time required on previous systems, as well as research into low-moment materials, such as ultra-thin magnetic films, nanowire arrays and particles, dilute magnetic semiconductors, and paleomagnets.
The system’s software simplifies VSM control and combines standard predefined measurement routines with configurable field and measurement loops to provide a flexible data acquisition environment. In addition, the 8600 offers advanced scripting capabilities for customized experiments, putting the researcher fully in control of their unique measurement process.
Also at the Joint MMM-Intermag exhibit, attendees can learn about Lake Shore’s:  
  • Magnetic test and measurement instrumentation, including the new F71 and F41 teslameters for convenient, dependable field measurements (a demo unit with Hall probes will be on display).
  • Cryogenic probe stations with integrated in-plane and out-of-plane magnets for DC, RF, microwave, and THz-frequency probing of material samples in fields to more than 2 T and at temperatures below 4 K.
  • New options for electromagnet-based material characterization to be introduced later this year.