Photovoltaic material measurement products focus of Lake Shore SPIE exhibit
Company showcasing cryogenic probe station and current source solutions for material characterization
Lake Shore Cryotronics will be at the SPIE Optics + Photonics Exhibition in San Diego next week to discuss platforms optimized for the study of early-stage optical materials and devices.
High-performance solutions from Lake Shore include:
- Cryogenic probe stations for performing electro-optical, DC, RF, microwave, and THz-frequency (75 GHz and up) measurements of materials and devices, including photovoltaic materials and semiconductor optoelectronic devices, in a variable temperature environment. These versatile platforms, which provide superior results and productivity when compared to traditional methods requiring manual immersion of devices in liquid nitrogen, include cryogen-free, CCR-based models, integrated magnet models, and stations supporting backside optical illumination of a sample (ideal for examining photosensitive materials with topside metallization). On display in Booth 339 will be the Model TTPX, an entry-level station well-suited for a wide variety of device measurements.
- MeasureReady™ 155 precision I/V sources. Ideal for any application requiring a high-quality, low-noise source of current or voltage, these instruments provide a solid foundation for DC I-V and C-V curve, AC impedance, Hall effect, resistance, resistivity, and other fundamental material measurements. In addition, they support very low-power excitation of sensitive materials, like organics, and feature an in-phase AC reference output, which provides a convenient way to sync up with a lock-in amplifier to detect extremely low signal levels in the presence of other noise sources—a scenario common for semiconductor device measurements. The 155 sources are also simple to operate, with a smartphone-based touchscreen interface, allowing for quick setup and use in labs regularly performing rapid testing of various devices. Please stop by Booth 339 to see a demonstration of how easy the instrument is to use.
- Hall effect measurement systems for determining the mobility and carrier concentration of materials, including wafer-scale materials, as a function of temperature and field. These robust systems facilitate a broad range of research applications, including photovoltaic, organic electronic, transparent conducting oxide, III-V, and III-VI semiconductor research, and include an AC field Hall option for characterizing materials with very low mobilities (down to 0.001 cm2/V s). Systems can also be specified with optical access for exposure of samples to different wavelengths of light via a laser or a fiber optic connection.