Lake Shore Cryotronics will be discussing characterization and temperature measurement solutions for cryoelectronic applications at next week’s 12th International Workshop on Low Temperature Electronics (WOLTE-12) in Tempe, AZ.
Lake Shore material characterization products enable researchers to isolate defects in materials and, in some platforms, early-stage device structures as a function of temperature and high field. Evaluating fundamental electrical properties at cryogenic temperatures can assist in the development of faster, more efficient electronic devices. Platforms include:
The Model 8501 THz system, a fully integrated characterization system that uses THz-frequency energy and a high-field cryostat to measure spectroscopic responses of research-scale materials, such as ultrathin epilayers, bulk semiconductors, and buried thin films in pre-device stage heterostructures. Spectroscopic measurements obtained by the system can provide important insights during photovoltaic, organic electronic, and spin-based computing R&D.
Cryogenic probe stations for wafer-scale process verification and the measurement of properties for TMD and 2D material transistor, CNT device, and GaN device development. Also now available: a THz-frequency probe arm option for on-wafer probing of millimeter-wave devices at 75 GHz and up frequencies, enabling calibrated S-parameter measurements of MMIC, MEMS, LNA, THz detector, and superconducting circuit designs.
Hall effect measurement systems for determining the mobility and concentration of multiple carriers in III-V, II-VI, and elemental semiconductors, metal oxides, and complex oxide systems, and when using an AC field Hall option for characterizing low-mobility materials, particularly those in photovoltaic, thermoelectric, and organic electronic applications.
At WOLTE-12, Lake Shore will also be discussing temperature measurement products, such as:
- Industry-leading Cernox™, platinum, silicon diode, germanium and ruthenium oxide sensors.
- Temperature instruments, including the Model 372 AC resistance bridge/temperature controller for continuous cryogenic control in the sub-1 K range (when used with the appropriate sensor).
- New 240 Series sensor input modules for convenient PLC-based temperature monitoring in large-scale physics and superconductivity research applications.