Lake Shore IMS exhibit to feature high-frequency cryogenic probing solutions
Lake Shore IMS exhibit to feature high-frequency cryogenic probing solutions

Lake Shore will showcase the latest in high-frequency device probing and measurement platforms at the May 24 – 26 IEEE MTT International Microwave Symposium (IMS), in San Francisco.

These platforms include industry-leading cryogenic probe stations for non-destructive measurement of materials and devices as a function of low temperature and high magnetic field using on-wafer DC, RF, or microwave probing. Cryogenic probe stations especially benefit early-stage device R&D applications where fundamental IV, CV, and similar electrical measurements of test structures are necessary, including those used to study CNT, GaN, SiGe, superconducting, and organic semiconductor designs.

Lake Shore offers probe stations with cryogen-free CCR or liquid cryogen operation, in various configurations, including an affordable tabletop model for probing devices on full and partial wafers up to 51 mm (2 in) in diameter. This version, the Model TTPX, will be set up in the Lake Shore booth at IMS.

Also on display will be a demo version of a forthcoming cryogenic THz probe arm option. This unique contact-probing solution, designed for precise on-wafer probing of millimeter wave devices at 75 to 110 GHz and 140 to 220 GHz frequencies, enables calibrated S-parameter and other high-frequency measurements to be performed at variable temperatures in a cryogenic environment. These measurements offer specific value to researchers involved in developing new MMIC, MEMS, or LNA designs.

In a related event, during Thursday’s THIF2 interactive forum, Lake Shore Application Scientist Dr. David Daughton will present a paper (“Cryogenic Temperature, 2-Port, On-Wafer Characterization at WR-5.1 Frequencies”) reporting on measurements obtained using a prototype of the cryogenic THz probe arm.

In addition, Lake Shore will be discussing their:

  • 8500 Series THz material characterization system, a fully integrated system for non-contact characterization of materials across a wide range of frequencies, temperatures, and field strengths.
  • 8400 Series Hall effect measurement system with an AC field Hall measurement option for characterizing materials with mobilities down to 0.001 cm2/V s.
  • Cryogenic temperature measurement products, including the popular Cernox™ sensors. Because they offer high stability over repeated thermal cycling and under lengthy exposure to ionizing radiation, and feature low magnetic field-induced errors, they are ideal for radio astronomy or satellite applications.