Lake Shore Cryotronics will be discussing its cryogenic probe stations and new terahertz (THz) based materials characterization system at the SPIE Optics + Photonics Exhibition, Aug. 19 – 21, in San Diego.
Cryogenic probe stations are platforms used to probe materials and devices in temperature-controlled and magnetic environments in order to measure electro-optical, magneto-transport, DC, RF, or microwave properties. Measuring device performance as a function of temperature is particularly important in many photonic or electro-optical R&D processes. Lake Shore cryogenic probe stations offer a convenient, non-destructive way to reliably test devices, as well as novel photovoltaic materials, in a tightly controlled environment (to as low as 1.6 K, depending on the model).
A number of versions are available from Lake Shore, including cryogen-free CCR (closed-cycle refrigerator) models, its entry-level Model PS-100 station designed for fast delivery and setup, and a compact, tabletop model that supports backside optical illumination of the sample stage, which is ideal for examining photosensitive materials with topside metallization.
Also at SPIE Optics + Photonics, attendees can learn about the award-winning Model 8501 THz system for materials characterization. The fully integrated, non-contact measurement platform uses THz-frequency energy and a built-in low-temperature, high-field cryostat to measure material spectroscopic responses across a wide range of frequencies, temperatures, and field strengths.
THz spectroscopy can be very helpful for transparent conductive oxide and dielectric material research. Lake Shore’s THz system is unique because, unlike conventional time-domain (TDS) spectroscopy systems, it uses a continuous wave (CW) spectrometer for higher spectral resolution. Spectral profiles generated by the system can reveal interesting phenomena not visible with conventional characterization techniques.
Lake Shore will also be discussing:
- Precision Hall effect measurement systems, available with AC field Hall option for measuring high-resistivity, low-mobility materials down to 0.001 cm2/Vs. These systems are ideal for developers who need to characterize novel photovoltaic materials.
- Sensors and instruments for stable and reliable low-temperature measurements.
- Programmable DC current sources for measuring resistive and semiconductor devices, and for LED brightness testing.
- Magnetometer systems (VSM/AGMs) for characterizing magnetic properties of a wide range of samples, including those used in magneto-optical media development.
For more information, SPIE Optics + Photonics attendees can visit Booth 326.