Lake Shore Cryotronics will discuss its soon-to-be-released Model 8407 DC Hall effect measurement system (HMS), as well as its other industry-leading materials characterization systems, at the Materials Research Society (MRS) Fall Meeting, Dec. 1-6 in Boston, Mass.
The new system uses a 7-inch magnet and produces higher fields than the company’s existing Model 8404 HMS, for those materials requiring higher DC fields for characterization.
This new system is ideal for measuring materials with mobilities from 1 to 106 cm2/V s and for making variable temperature measurements. The Model 8407 provides higher field strengths at variable temperatures than is possible with the Model 8404. The higher field of the Model 8407 is also an advantage when analyzing materials that fall at the low end of the mobility range of DC measurements.
Lake Shore will also soon release an updated version of its 8400 Series software, which will offer Model 8404 and Model 8407 users greater flexibility in performing various measurements, such as:
- van der Pauw and Hall bar measurements
- measurements of samples with gated Hall bars to account for gate bias
- time loops of measurements for longer unattended operation
- other functions for easier system control
“We’re excited to meet with customers at this year’s MRS Fall Meeting and to unveil our new Hall measurement options,” said Brad Dodrill, Lake Shore VP of Sales. “The new system and software will enable even better measurements for furthering materials research.”
Also at the show, Lake Shore Senior Scientist Jeff Lindemuth will present a paper on AC field Hall measurement, titled “Electronic Transport Characterization of BiVO4 Using AC Field Hall Technique.” The presentation will take place Dec. 2 at 2:30 p.m.
MRS Fall Meeting attendees can visit Booth 800 on the floor of the Hynes Convention Center to speak with Lake Shore representatives about the company’s Hall effect measurement systems. Lake Shore will also provide information about its cryogenic and cryogen-free probe stations for non-destructive testing of devices on full and partial wafers; its prototype terahertz (THz) materials characterization system; and vibrating sample magnetometer (VSM) and alternating gradient magnetometer (AGM) systems.