Dr. Jeff Lindemuth to showcase photonic material characterization & optical device test capabilities at SPIE Optics and Photonics
Model 8404 Hall System

Lake Shore will feature its new cryogen-free cryogenic probe stations and the Model 8404 Hall effect measurement system at SPIE Optics and Photonics, August 12 to 16, at the San Diego Convention Center in San Diego, CA, in Booth #1122.​

Dr. Jeffrey R. Lindemuth, a Lake Shore senior scientist, will present a paper, “Variable Temperature Hall Measurements on Low-Mobility, High-Resistivity Materials.” This paper will be part of Session 4: Novel PV Materials and Characterization Methods, on Sunday August 12, from 3:30 to 5:10 p.m. The results presented in this paper were achieved using the Lake Shore Model 8404 Hall effect measurement system and reflect breakthrough characterization capabilities that are important to developers of novel photovoltaic materials. The new Model 8404 has an optional AC field measurement capability that enables measurement of Hall mobilities down to 0.001 cm2/V s, lower than ever possible using traditional DC field Hall measurement techniques. The system comes with optional variable temperature assemblies for temperatures from 15 K to 1273 K.

Lake Shore will also be at the exhibition center, with product experts on hand to discuss the Model 8404 as well as the advantages of the company’s new cryogen-free probe stations, including the newest low cost CRX-6.5 K probe station. These easy-to-operate cryogenic platforms enable convenient and versatile testing of optical devices, providing superior results and productivity when compared to traditional methods requiring manual immersion of test devices in liquid nitrogen.