Sample Holders

Grounded sample holder

Direct contact to the sample stage to minimize thermal gradient to sample; electrically grounded to station chassis

Triaxial sample holder

Electrically isolated sample surface with electrically isolated guard layer between sample surface and ground; external connection for sample surface and guard in chamber base with triaxial feedthrough

Coaxial sample holder

Electrically isolated sample surface with external connection for backside bias of the sample in chamber base with BNC feedthrough

Optical access sample holder (-O, TTPX only)

Any configuration sample holder with a 5 mm hole in the center for direct line of sight to backside of sample

Ring magnet sample holder kit

The ring magnet sample holder kit provides a convenient, low-cost way to perform device testing under limited magnetic field conditions in the PS-100, TTPX, CPX, CRX-4K, and CRX-6.5K probe stations. (It is not compatible with probe stations using a low temperature option.) The kit includes a set of 4 ring magnets, 3 matched spacers, and a special, grounded sample holder to mount the magnets in one of four possible configurations.

The magnets are positioned 1 mm above the top of the sample holder, creating nominal fields of 0.19 T, 0.177 T, 0.144 T, and 0.085 T at the sample holder elevation. The actual magnetic field obtained will depend on the magnet temperature. Standard operating temperature ranges for the probe station apply.

Sample holder configurations

	Sample holder type	Feedthrough required	TTPX, PS-100	CPX, CRX-6.5K, CRX-4K	CPX-VF, CRX-VF	EMPX-H2, CRX-EM-HF	FWPX
Included with station	Grounded	None	Ø32 mm (1.25 in)	Ø32 mm (1.25 in)	Ø32 mm (1.25 in)	Ø25 mm (1 in)	Ø102 mm (4 in)
Optional	Grounded	None	Ø51 mm (2 in)	Ø51 mm (2 in)	Ø51 mm (2 in)	Ø25 mm (1 in)	Ø102 mm (4 in)
	Coaxial	FT-BNC
	Triaxial	FT-TRIAX
	Ring magnet	None	Ø17 mm (0.68 in)	Ø17 mm (0.68 in)	NA	NA	NA
-Optical (TTPX only) —require FT-OPTIC	Grounded-O	None	Ø32 mm (1.25 in) or Ø51 mm (2 in)
	Coaxial-O	FT-BNC
	Triaxial-O	FT-TRIAX

Sample holder specifications

	Electrical isolation*	Temperature difference**	Maximum temperature
Grounded	NA	0.1 K to 0.2 K	475 K***
Coaxial	>100 MΩ	approximately 1 K	400 K
Triaxial	>100 GΩ	approximately 1 to 2 K	400 K
Isolation measured at 100 V potential between conductive surfaces Temperature difference between the top of the sample holder and the sample stage temperature sensor. Additional temperature difference can be expected between the sample and sample holder, depending on mounting technique and experimental heat load. **500 K when used in CRX-VF

Feedthroughs

FT-BNC	2-lug BNC feedthrough installed and wired for coaxial sample holders
FT-TRIAX	3-lug triaxial feedthrough installed and wired for triaxial sample holders

Optical access kit

FT-OPTIC

Optical access kit—includes window, window holder, tower, and related components