If you’ve been considering adding a cryogenic probe station to your lab, here’s another reason to do so: For a limited time, eligible probe stations are now provided with an M81-SSM instrument and SMU-10 technology at no extra cost.
This means you not only get a highly versatile platform for variable temperature research, but also source measure instrumentation for applying stimulus to samples and measuring their response — without having to supply separate instruments yourself.
Beyond that, the included M81-SSM with SMU-10 provides additional DC and AC measurement capabilities versus the typical DC I-V instrumentation often used for probe station sample testing. Together, they offer:
- Voltage and current stimulus and response measurements from DC to 100 kHz
- Integrated lock-in detection for low-level signal measurements, with lock-in voltage sensitivity down to the nanovolt level
- High-sensitivity current measurement for nanoscale devices and low-signal measurements, including DC current sensitivity below 100 fA
- I-V sweep capability with synchronized source and measurement timing
- User-configurable digital filtering for minimizing measured noise and decreasing testing time
- A probe station-friendly source/measure topology that can help reduce probe arm requirements and minimize thermal impact in multi-terminal cryogenic measurement setups
All these capabilities combined make the SMU-10 the ideal addition to any low-temperature probing application, offering low-noise sourcing and precision measurement suited to cryogenic on-wafer characterization. Explore everything the technology has to offer.
Note: Some specifications of the M81 and SMU may be diminished slightly when measuring samples in the probe station due to the cryogenic system signal paths. In addition, products included as part of this promotion are provided separately from the probe station (not fully integrated).