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| Model TTP4 Cryogenic Probe Station Features |
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- High stability operation from 3.2 K to 475 K
- Active cryogenic control of the cold head and radiation shield
- Measurements from DC to 67 GHz
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to four micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- High resolution optical system
- Tabletop design with small footprint
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| Product Description |
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| The Model TTP4 is a versatile cryogenic micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The TTP4 is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in a TTP4. A wide selection of probes, cables, sample holders, and options makes it possible to configure the TTP4 to meet your specific measurement applications.
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The TTP4 cryogenic probe station operates over a temperature range of 4.2 K to 475 K. With options, the base temperature can be extended down to 3.2 K. The probe station provides efficient temperature operation and control with a continuous refrigeration system using either helium or nitrogen. Vapor-cooled shielding optimizes efficiency and intercepts blackbody radiation before it reaches the sample. Two control heaters on the cold head minimize temperature gradients across the sample and, along with the radiation shield heater, provide the probe station with fast thermal response.
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The TTP4 cryogenic probe station is user configured with up to four ultrastable micro-manipulated stages, each providing precise 3-axis control of the probe position to accurately land the probe tip on the device features. Proprietary probe tips in a variety of sizes and materials minimize thermal mass and optimize electrical contacts to the device under test (DUT). Probe tips are thermally linked to the cold head to minimize heat transfer to the DUT.
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For increased versatility, TTP4 options include a 3.2 K base temperature stage, vibration isolation systems, LN2 Dewar kit, higher magnification monoscopes, vacuum turbo pumping system, supplemental radiation shield temperature control, and fiber optic probe arm modification.
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 Custom configure a TTP4 Cryogenic Probe Station |
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