Model TTP4-1.5 K Cryogenic Probe Station

• High stability operation from 1.5 K to 475 K
• Active cryogenic control of the cold head, mid-stage, and radiation shield
• Reduces potential for sample condensation by allowing sample to remain at room temperature while the system cools to 1.5 K
• Measurements from DC to 67 GHz
• Accommodates up to 25 mm (1 in) diameter wafers
• Configurable with up to four micro-manipulated probe arms
• Probe arms with 3-axis adjustments and ±5° theta planarization
• High resolution optical system
• Tabletop design with small footprint

The TTP4-1.5K cryogenic probe station operates over a temperature range of 1.5 K to 475 K. The probe station provides efficient temperature operation and control with a continuous refrigeration system using either helium or nitrogen. Vapor-cooled shielding optimizes efficiency and intercepts blackbody radiation before it reaches the sample. Two control heaters on the cold head minimize temperature gradients across the sample and, along with the mid-stage and radiation shield heaters, provide the probe station with fast thermal response.

The TTP4-1.5K cryogenic probe station is user-configured with up to four ultra-stable micro-manipulated stages, each providing precise 3-axis control of the probe position to accurately land the probe tip on device features. Proprietary probe tips in a variety of sizes and materials minimize thermal mass and optimize electrical contacts to the device under test (DUT). Probe tips are thermally linked to the mid-stage to prevent heat transfer to the DUT.

For increased versatility, TTP4-1.5K options include vibration isolation systems, LN₂ Dewar kit, higher magnification monoscopes, vacuum turbo pumping system, and fiber optic probe arm modification.