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 Cryogenic Probe Stations

   
 Model #
Refrigerator
Vacuum
Optional
High Vacuum
Max # of
probe arms
Temperature
range
Optional Temperature Range
Max sample size
Sample Stage Rotation
Magnet field
Optional
Load-lock
 CRX-4K
Closed
Cycle
10-5 torr
NA
6
4.5 K to 350 K
50 K to 475 K*
51 mm (2 in) diameter
NA
NA
NA
 FWPX
Flow Cryostat
10-5 torr
NA
6
4.5 K to 475 K
NA
102 mm (4 in) diameter
±5°
NA
NA
 EMPX-HF
Flow Cryostat
10-5 torr
NA
4
5 K to 400 K
10 K to 400 K with 360° rotation option
NA
25 mm (1 in) diameter
±360° (Optional)
0.55 T horizontal electromagnet field
NA
 CPX-HF
Flow Cryostat
10-5 torr
10-7 torr
4
4.2 K to 400 K
2 K to 400 K
25 mm (1 in) diameter
±5°
1 T horizontal superconducting magnet field
NA
 CPX-VF
Flow Cryostat
10-5 torr
10-7 torr
6
4.2 K to 400 K
2 K to 400 K
51 mm (2 in) diameter
±5°
2.5 T vertical superconducting magnet field
NA
 CPX
Flow Cryostat
10-5 torr
10-7 torr
6

4.2 K to 475 K
10 K to 400 K with load-lock

1.5 K to 475 K*
Cannot be used with load-lock sample assembly

51 mm (2 in) diameter
12.7 mm (0.5 in) with load-lock

±5°
NA
Yes
 TTPX
Flow Cryostat
10-5 torr
NA
6
4.2 K to 475 K
3.2 K to 475 K*
51 mm (2 in) diameter
NA
NA
NA
*The above specs include equipment options.
CRX-4K 
Cryogenic Probe Station
Cryogen-Free 4 K Closed Refrigerator-Based Cryogenic Probe Station

 Features

  • Low vibration, cryogen-free closed cycle refrigerator
  • Up to six micro-manipulated probe stages
  • Temperature range capabilities from 4.5 K to 475 K
  • Up to 51 mm (2 in) diameter wafer capabilities
Spacer
FWPX Cryogenic Probe Station
4-Inch Wafer Cryogenic Probe Station

 Features

  • Up to six micro-manipulated probe stages
  • Standard temperature range from 4.5 K to 475 K
  • ±5° sample stage rotation
  • Up to 102 mm (4 in) diameter wafer capabilities

Spacer
EMPX-HF Cryogenic Probe Station
Electromagnet-Based Horizontal Field Cryogenic Probe Station

 Features

  • 0.55 T horizontal (in-plane field) electromagnet
  • Up to four micro-manipulated probe stages
  • Standard temperature range from 5 K to 400 K
  • Up to 25 mm (1 in) diameter wafer capabilities
  • 360° sample stage rotation option
Spacer
CPX-HF Cryogenic Probe Station
Superconducting Magnet-Based Horizontal Field Cryogenic Probe Station

Features

  • 1 T horizontal field split pair superconducting magnet
  • Up to four micro-manipulated probe stages
  • Temperature range capabilities from 2 K to 400 K with field on or off
  • ±5° sample stage rotation
  • Up to 25 mm (1 in) diameter wafer capabilities
  • High vacuum option
Spacer
CPX-VF Cryogenic Probe Station
Superconducting Magnet-Based Vertical Field Cryogenic Probe Station

Features

  • 2.5 T vertical field solenoid superconducting magnet
  • Up to six micro-manipulated probe stages
  • Temperature range capabilities from 2 K to 400 K with field on or off
  • ±5° sample stage rotation
  • Up to 51 mm (2 in) diameter wafer capabilities
  • High vacuum option
Spacer
Model CPX Cryogenic Probe Station
Field-Upgradeable Cryogenic Probe Station

Features

  • Up to six micro-manipulated probe stages
  • Temperature range capabilities from 1.5 K to 475 K
  • Up to 51 mm (2 in) diameter wafer capabilities
  • ±5° sample stage rotation
  • Load-lock and high vacuum options

Spacer
TTPX Cryogenic Probe Station
Table-Top Cryogenic Probe Station

Features

  • Up to six micro-manipulated probe stages
  • Temperature range capabilities from 3.2 K to 475 K
  • Up to 51 mm (2 in) diameter wafer capabilities
  • Optical access through sample stage
 
Spacer
Model #
PS-HV-CPX High Vacuum
PS-LL-CPX
Load-Lock
PS-LT
PS-VLT-CPX
CRX-4K
FWPX
EMPX-HF
CPX-HF
10-7
2 K
CPX-VF
10-7
2 K
CPX
10-7
Yes
2 K
1.5 K*
TTPX
3.2 K
 
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