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| Model HFTTP4 Cryogenic Probe Station Features |
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- 10 k0e (1 T) horizontal field superconducting magnet
- High stability operation from 2 K to 400 K
- Active cryogenic control of the cold head, magnet stage, and radiation shield
- Reduces potential for sample condensation by allowing sample to remain at room temperature while the system cools to 2 K
- Measurements from DC to 67 GHz
- Accommodates up to 25 mm (1 in) diameter wafers
- Configurable with up to four micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- High resolution optical system
- Non-magnetic vibration isolation table
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| Product Description |
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The Model HFTTP4 is a versatile cryogenic micro-manipulated probe station used for nondestructive magnetic testing of devices on full and partial wafers up to 25 mm (1 in) in diameter. The HFTTP4 cryogenic probe station is a platform for measurement of magneto-transport, electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, semiconductors, superconductors, and spintronic devices are typical materials measured in a HFTTP4. A wide selection of probes, cables, sample holders, and options makes it possible to configure the HFTTP4 to meet your specific measurement applications. |
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Mounted on a non-magnetic vibration isolation table,
the HFTTP4 is equipped with a 10 k0e (1 T) horizontal
split-pair superconducting magnet. The HFTTP4
operates over a temperature range of 4.2 K to 400 K.
With options, the base temperature can be extended
down to 2 K. The probe station provides efficient
temperature operation and control with a continuous
refrigeration system using either helium or nitrogen.
Vapor-cooled shielding optimizes efficiency and
intercepts blackbody radiation before it reaches the
sample. A wire wound control heater on the cold head
minimizes temperature gradients across the sample and,
along with the magnet stage and radiation shield
heaters, provides the probe station with fast thermal
response.
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The HFTTP4 is user configured with up to four ultrastable micro-manipulated stages, each providing precise 3-axis control of the probe position to accurately land the probe tip on device features. Proprietary probe tips in a variety of sizes and materials minimize thermal mass and optimize electrical contacts to the device under test.
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For increased versatility, HFTTP4 options include a 2 K base temperature stage, LN2 Dewar kit, higher magnification monoscopes, vacuum turbo pumping system, and fiber optic probe arm modification. |
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Custom configure a HFTTP4 Cryogenic Probe Station |
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