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Home > Lake Shore Products > Cryogenic Probe Stations > Model FWPX Cryogenic Probe Station Tech Specs
 

 Model FWPX

 4-Inch Wafer Cryogenic Probe Station
 
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Specifications
 
Temperature
Operating temperature range—overall  4.5 K to 475 K*
    ZN50 DC/RF probe with low RF cryogenic coaxial cable  4.5 K to 475 K*
     ZN50 DC/RF probe with high RF semirigid coaxial cable
 4.5 K to 400 K*
     GSG microwave probe with semirigid coaxial cable
 4.5 K to 350 K*
Temperature control (heaters)

     Sample stage
 100 W (2 parallel heaters, 50 W each)
     Radiation shield  100 W
     Probe arm  Measurement only
*Selectable equipment
 
Probe Arm and Sample Stage Adjustments
Probe arm travel
     X axis  127 mm (5 in)
     Y axis
 51 mm (2 in)
     Z axis
 18 mm (0.7 in)
Translation scale
     X axis  20 µm
     Y and Z axes
 10 µm
    Theta planarization*
 ±5°
Sample stage (sample holder)
     In-plane rotation  ±5°
     In-plane translation
 Yes
*Included with microwave probes
 
Frequency Range
ZN50 DC/RF probe frequency range

     Tungsten with cryogenic coaxial cable
 0 to 50 MHz*
     Tungsten with semirigid coaxial cable  0 to 1 GHz*†
     Paliney 7 with cryogenic coaxial cable  0 to 50 MHz*
     Paliney 7 with semirigid coaxial cable  0 to 1 GHz*†
     BeCu with cryogenic coaxial cable  0 to 50 MHz*
     BeCu with semirigid coaxial cable  0 to 1 GHz*†
GSG microwave probe frequency range

     Low frequency with K connector
 0 to 40 GHz*
     Mid frequency with 2.4 mm connector  0 to 50 GHz*
     High frequency with 1.85 mm connector  0 to 67 GHz*
arrow Click here for probe & cable features
* Selectable equipment
† S21 > -10 dB up to 1 GHz, except for a (-40 dB) spike between 400 MHz and 800 MHz depending on probe model and placement; S11 < -3 dB up to 1
GHz
 
Optical
Optical viewport—located on top lids  Ø91 mm (3.6 in) outer window and Ø152 mm (6 in) inner window
     Outer, clear fused quartz  99% IR transmittance
     Inner  IR absorbing with narrow band visible light transmittance
Optical resolution—microscope  
     7:1 zoom  8 μm
     16:1 zoom  8 μm*
* Selectable equipment
 
Sample Holder (Chuck)
Maximum sample size—overall  Up to Ø102 mm (4 in)
     SH-4.00-4G, grounded chuck  Up to Ø102 mm (4 in) and 475 K
     SH-4.00-4C, coaxial chuck  Up to Ø102 mm (4 in) and 400 K*
     SH-4.00-4T, triaxial chuck  Up to Ø102 mm (4 in) and 400 K*
*Selectable equipment
garrow Click here to select a sample chuck (holder)
 
Standard Equipment
Flow cryostat
 4.5 K to 475 K
     Sample stage temperature sensor  Lake Shore Model DT-670-SD-1.4H calibrated silicon diode
     Sample stage heater  100 W (2 parallel heaters, 50 W each)
Cooled radiation shield and cooled IR-absorbing window above the sample
     Temperature sensor  Lake Shore Model DT-670C-CU silicon diode
     Radiation shield heater  100 W
     Removable top lid with viewport  Ø152 mm (6 in) window
Temperature controller
 Lake Shore Model 340 with 3462 expansion card and Model 142 200 W (two  channels, 100 W each) power supply (independent regulation of sample  stage and radiation shield, and probe arm temperature monitoring)
Electroless nickel-plated aluminum vacuum chamber
     Diameter  254 mm (10 in)
     Removable top lid with clear fused quartz viewport  Ø91 mm (3.6 in) window
     Probe ports  6 surround the sample thermal radiation shield
     Pump port  NW40 (pump sold separately)
     Gas purge and 0.5 psi safety pop-off port  NW25
     Spare port  NW25
Machined aluminum base plate
 846 mm2 (33.3 in2)
PS-TMC vibration isolation system
 Includes pneumatically driven gimbal piston isolator, actuators, and  supports; self leveling with a resonant frequency below 2 Hz; requires 40 psi   nitrogen or air
     Isolator natural frequency  Vertical 0.8 Hz, horizontal 1.0 Hz
     Isolation efficiency at 5 Hz  Vertical 80 to 97%, horizontal 60 to 90%
     Isolation efficiency at 10 Hz  Vertical 90 to 99%, horizontal 70 to 95%
Temperature sensor installed and wired to a 6-pin feedthrough (included on one probe arm)
Grounded sample holder
 SH-4.00-4G, accommodates up to a Ø102 mm (4 in) sample with a Ø102 mm  (4 in) probe area
Optics
     
     Zoom 70 microscope
 7:1 zoom with 4 μm resolution
     Color CCD camera  S-video or composite output format
     Swing arm  Optics can be manipulated to view any part of the sample or wafer, and can  be retracted and swung away to allow access to the top of the vacuum  chamber for sample exchange
     Video monitor  High resolution, 17-inch
     Sample illumination  Coaxial via fiber optic or ring light from an adjustable light source and power
 supply (must specify sample illumination at time of order)
 NOTE: Coaxial illumination is recommended for highly reflective  materials
High efficiency helium transfer line with foot valve for precise flow regulation
Instrument console
Basic tools and spares kit for standard operation
 
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