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Features of New Model EMTTP4 Probe Station |
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- 5.5 kOe (0.55 T) horizontal (in plane) field electromagnet
- 360° sample stage rotation option
- High stability operation from 5 K to 475 K
- Active cryogenic control of the cold head andradiation shield
- Measurements from DC to 67 GHz
- Accommodates up to 25 mm (1 in) diameter wafers
- Configurable with up to four micro- manipulatedprobe arms
- Probe arms with 3-axis adjustments and ±5°theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- High resolution optical system
- Non-magnetic vibration isolation table
- Options and accessories for customization to specificresearch needs
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Description |
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The Model EMTTP4 is a versatile cryogenic electromagnet based
micro-manipulated probe station used for nondestructive
testing of devices on full and partial wafers up
to 25 mm (1 in) in diameter. The EMTTP4 is a platform
for measurement of magneto-transport, electrical, electro-optical,
parametric, high Z, DC, RF, and microwave
properties of materials and test devices. Nanoscale
electronics, quantum wires and dots, semiconductors,
superconductors, and spintronic devices are typical
materials measured in an EMTTP4. A wide selection of
probes, cables, sample holders, and options makes it
possible to configure the EMTTP4 to meet your specific
measurement applications.
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Mounted on a vibration isolation table, the EMTTP4 is
equipped with a 5.5 k0e (0.55 T) horizontal (in-plane)
field electromagnet. The EMTTP4 operates over a
temperature range of 5 K to 475 K. The probe station
provides efficient temperature operation and control with
a continuous refrigeration system using either helium or
nitrogen. Field dependent measurements at ambient
temperature are possible without the use of cryogens.
Liquid helium is only required for cooling the device under
test (DUT) to below 80 K. Vapor-cooled shielding
optimizes efficiency and intercepts blackbody radiation
before it reaches the sample. A 100 W cartridge heater on
the cold head minimizes temperature gradients across the
sample and, along with independent control of radiation
shield heaters, provides the probe station with fast
thermal response.
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The EMTTP4 is user configured with up to four ultra-stable
micro-manipulated stages, each providing precise 3-axis
control of the probe position to accurately land the probe
tip on device features. The 360° sample stage rotation option allows you to measure angular-dependent
and anisotropic magneto-transport properties
of the DUT. Proprietary probe tips in a variety of sizes and
materials minimize thermal mass and optimize electrical
contacts to the DUT. Probe tips are thermally linked to the
cold head to minimize heat transfer to the DUT.
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For increased versatility, EMTTP4 options include 360° sample stage rotation, a LN2
Dewar kit, higher magnification monoscopes, vacuum
turbo pumping system, pump-line vibration isolator,recirculating chillers, and fiber optic probe arm modification. |
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To speak with one of our experts please contact: |
Tel: (614) 891-2244 Fax: (614) 818-1600
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