| Maximum field |
5.5 kOe (0.55 T)* |
| Probe movement due to magnet field ramping to 5.5 kOe (0.55 T) |
<5 μm |
|
Field uniformity (at 70 A)
10 mm diameter wafer |
0.6% |
| 12.7 mm diameter wafer |
1.1% |
| 20 mm diameter wafer |
2% |
| 25.4 mm diameter wafer |
2.6% |
|
| Field control stability |
<50 mG RMS** |
|
*Hall probe is calibrated to read field at the center of the magnet gap
**With settle band of 100 mG |
| |
| Temperature |
| Sample temperature range—standard* |
4.5 K to 400 K |
| Sample temperature range—optional* |
3.2 K to 400 K** |
|
Temperature control (heaters)
Sample stage |
100 W |
| Radiation shields |
Two, 100 W each |
| Probe arm |
Measurement only |
|
| Temperature control stability |
| With LHe |
5.5 K to 50 K |
<5 mK RMS |
| 50 K and higher |
<50 mK RMS |
| With LNc |
80 K and higher |
<100 mK RMS |
|
*Limited from 8 K to 400 K when configured with the PS-360-EMPX 360°
sample stage rotation option
** Selectable equipment |
| |
 |
| |
| Probe Arm Adjustments |
| Travel |
| X axis |
51 mm (2 in) |
| Y axis |
25 mm (1 in) |
| Z axis |
18 mm (0.7 in) |
|
| Translation scale |
| X axis |
20 µm |
| Y and Z axes |
10 µm |
| Theta planarization* |
±5° |
|
| Sample stage (sample holder) |
| In-plane rotation |
360° |
|
*Included with microwave probes
**Optional — recommended when taking measurements using
microwave probes |
| |
| Frequency Range |
ZN50 DC/RF probe frequency range
Tungsten with cryogenic coaxial cable |
0 to 50 MHz* |
| Tungsten with semirigid coaxial cable |
0 to 1 GHz*† |
| Paliney 7 with cryogenic coaxial cable |
0 to 50 MHz* |
| Paliney 7 with semirigid coaxial cable |
0 to 1 GHz*† |
| BeCu with cryogenic coaxial cable |
0 to 50 MHz* |
| BeCu with semirigid coaxial cable |
0 to 1 GHz*† |
|
GSG microwave probe frequency range
Low frequency with K connector |
0 to 40 GHz* |
| Mid frequency with 2.4 mm connector |
0 to 50 GHz* |
| High frequency with 1.85 mm connector |
0 to 67 GHz* |
Click here for probe & cable features |
|
* Selectable equipment
† S21 > -10 dB up to 1 GHz, except for a (-40 dB) spike between 400 MHz and 800 MHz depending on probe model and placement; S11 < -3 dB up to 1 GHz |
| |
| Optical |
| Optical viewport—located on top lids |
Ø54 mm (2.13 in) outer window and Ø50 mm (2 in) inner window |
| Outer, clear fused quartz |
99% IR transmittance |
| Inner |
IR absorbing with narrow band visible light transmittance |
|
| Optical resolution—microscope |
|
| 7:1 zoom |
8 μm |
| 16:1 zoom |
8 μm* |
|
| * Selectable equipment |
| |
| Sample Holder (Chuck) |
| Maximum sample size—overall |
Up to Ø25 mm (1 in) |
| SH-1.00-G-EM, grounded chuck |
Up to Ø25 mm (1 in) and 400 K |
| SH-1.00-I-EM, isolated chuck |
Up to Ø25 mm (1 in) and 400 K* |
| SH-1.00-C-EM, coaxial chuck** |
Up to Ø25 mm (1 in) and 400 K* |
| SH-1.00-T-EM, triaxial chuck** |
Up to Ø25 mm (1 in) and 400 K* |
*Selectable equipment
**Not available in combination with the 360° sample stage rotation feature |
Click here to select a sample chuck (holder) |
|