Many contemporary semiconductor and electronic materials are being developed for applications including photovoltaic (solar cell) and thermoelectric materials, new display technologies, organic electronics, and high power devices. The electronic properties of these materials are increasingly difficult to measure. In fact, current DC field electronic transport property measurement systems cannot measure many of these materials due to their low charge carrier mobilities and the high temperatures needed to characterize high power devices. A new measurement method is needed.
This emerging class of materials typically have mobilities below 1 cm2/V s. The challenge is to extract the diminishingly small Hall voltage from the background noise they produce. Lake Shore and Toyo have collaborated to develop the Model 8404 Hall effect measurement system (HMS), with an AC field Hall measurement option capable of measuring mobilities down to 0.001 cm2/V s. This offers a significant breakthrough in research productivity, allowing these materials to easily be measured.
The Model 8404 provides a range of Hall measurements on van der Pauw samples. The standard system is capable of DC field measurements and has a resistance range from 0.5 mΩ to 10 MΩ. AC field capability tops the list of an assortment of options including variable temperature assemblies, high and low resistance, and optical access. These add-ons broaden your measurement opportunities and simplify experimental processes. The Model 8404 HMS provides a robust platform to which you can add new features as your material measurement needs evolve.