Technical Specifications > Options

Cryogenic Probe Stations

Probes, Probe Tips, and Cables — Required User Configurable Equipment

ZN50 DC/RF PROBES

Ideal for: DC biasing, low/high frequency measurements, low noise shielded, and low-leakage guarded measurement
ZN50 probe base incorporates a pair of copper braids that anchor to the sample stage to dynamically cool/heat the probe to the sample temperature
SMA connector mounted directly to a replaceable alumina ceramic blade with a 50 Ω stripline routed to the probe contact

Part number (probe body)	Description
EMPX-HF: ZN50	50 Ω stripline probe body mount (each probe body mount requires a ceramic blade—selectable below)
CPX, CPX-VF and FWPX: ZN50-55I
CPX-HF, CRX-4K and TTPX: ZN50-26U

Part number (ceramic blade)	Tip material	Maximum frequency (GHz)	Maximum probe temperature*	Maximum sample temperature**	Tip radius (µm)
ZN50R-03-W	Tungsten	1 Maximum frequency 50 MHz with ZN50C-G or ZN50C-T cable; maximum frequency 1 GHz with MWC-XX-00K(-NM) cable	350 K	TTPX: 675 K CPX: 675 K CPX-HF: 400 K CPX-VF: 400 K CRX-4K: 500 K EMPX-HF: 400 K FWPX: 475 K	3
ZN50R-10-W					10
ZN50R-25-W					25
ZN50R-03-P7	Paliney 7				3
ZN50R-10-P7					10
ZN50R-25-P7					25
ZN50R-03-BECU	BeCu				3
ZN50R-10-BECU					10
ZN50R-25-BECU					25
ZN50R-100-BECU					100
ZN50R-200-BECU					200
As measured by the probe arm temperature sensor *Selectable equipment

Tungsten (W)	Beryllium Copper (BeCu)	Paliney 7 (P7-PdAu alloy)
Good conductivity	Low contact resistance	Low contact resistance
Excellent probe life	High current capability	High conductivity
Pierces oxide layers	High conductivity	Minimizes probe scrub
	Good for gold contact pads	Good probe life

ZN50 DC/RF CABLES

Part number	Cable type	Connector type	Feedthrough type	Measurement configuration	Maximum frequency	Maximum cable temperature*	Maximum sample temperature**
ZN50-G	Ultra-miniature cryogenic coaxial	SMA	BNC	Shielded	50 MHz	350 K	TTPX: 675 K CPX: 675 K CPX-HF: 400 K CPX-VF: 400 K CRX-4K: 500 K EMPX-HF: 400 K FWPX: 475 K
ZN50-T	Ultra-miniature cryogenic coaxial	SMA	3-lug triaxial	Low leakage	50 MHz
MWC-XX-00K (-NM)	Semirigid microwave coaxial	K (SMA compatible)	Loss-less compression seal	High frequency	1 GHz***
As measured by the probe arm temperature sensor Selectable equipment ** S21 > -10 dB up to 1 GHz, except for a (-40 dB) spike between 400 MHz and 800 MHz depending on probe model and placement; S11 < -3 dB up to 1 GHz

GSG MICROWAVE PROBES

Coplanar waveguide probe with ground-signal-ground (GSG) contact geometry
User-specified pitch (spacing)
Optimized low thermal conductivity coaxial leading to low thermal conductivity tips
Include a copper braid assembly to cool the probe to near sample temperature
Separate planarization module with ±5° rotation mechanism is also provided

Part number	Connector type	Maximum frequency (Ghz)	Maximum probe temperature*	Maximum sample temperature**	Pitch (µm)
GSG-050-40A-XXX-E/NM	K	40	350 K	TTPX: 675 K CPX: 675 K CPX-HF: 400 K CPX-VF: 400 K CRX-4K: 500 K EMPX-HF: 400 K FWPX: 475 K	50
GSG-100-40A-XXX-E/NM					100
GSG-150-40A-XXX-E/NM					150
GSG-200-40A-XXX-E/NM					200
GSG-250-40A-XXX-E/NM					250
GSG-050-50A-XXX-E/NM	2.4 mm	50			50
GSG-100-50A-XXX-E/NM					100
GSG-150-50A-XXX-E/NM					150
GSG-200-50A-XXX-E/NM					200
GSG-250-50A-XXX-E/NM					250
GSG-050-67A-XXX-E/NM	1.85 mm	67			50
GSG-100-67A-XXX-E/NM					100
GSG-150-67A-XXX-E/NM					150
GSG-200-67A-XXX-E/NM					200
GSG-250-67A-XXX-E/NM					250
As measured by the probe arm temperature sensor *Selectable equipment

GSG MICROWAVE CABLES

Loss-less compression seal
Semirigid with Teflon^® dielectric

Part number	Cable type	Feedthrough type	Maximum cable temperature*	Maximum sample temperature**	Connector type	Maximum frequency
MWC-XX-00K(-NM)	Semirigid microwave coaxial	Loss-less compression seal	350 K	TTPX: 675 K CPX: 675 K CPX-HF: 400 K CPX-VF: 400 K CRX-4K: 500 K EMPX-HF: 400 K FWPX: 475 K	K (SMA compatible)	40 GHz
MWC-XX-240(-NM)					2.4 mm	50 GHz
MWC-XX-185(-NM)					1.85 mm	67 GHz
As measured by the probe arm temperature sensor *Selectable equipment

SAMPLE HOLDERS

Typical sample holder configuration characterized by:

Leakage resistance between
- Top surface and guard
- Guard and ground
Capacitance between
- Top surface and guard
- Guard and ground

Types of sample holders

Grounded sample holder — sample mount surface at system ground
Isolated sample holder—backside contact not needed; sample mount surface is electrically non-conductive and isolated from ground
Coaxial sample holder—backside contact can be made; sample mount surface is isolated from ground
Triaxial sample holder—guarded backside contact can be made; sample mount surface has guarded isolation from ground

Part number	Measurement configuration	Separate feedthrough required	Maximum sample (diameter)	Maximum temperature
SH-0.50-T†	Triaxial	Yes**	Ø13 mm (0.5 in)	400 K
SH-1.00-G/O***	Grounded	No	Ø25 mm (1 in)	475 K
SH-1.00-I/O***	Isolated	No		400 K
SH-1.00-C/O***	Coaxial	Yes*
SH-1.00-T/O***	Triaxial	Yes**
SH-1.25-G	Grounded	No	Ø32 mm (1.25 in)	475 K
SH-1.25-I	Isolated	No		400 K
SH-1.25-C	Coaxial	Yes*
SH-1.25-T	Triaxial	Yes**
SH-2.00-G	Grounded	No	Ø51 mm (2 in)	475 K
SH-2.00-C	Coaxial	Yes*		400 K
SH-2.00-T	Triaxial	Yes**		400 K
SH-4.00-4G	Grounded	No	Ø102 mm (4 in)	475 K
SH-4.00-4C	Coaxial	Yes*		400 K
SH-4.00-4T	Triaxial	Yes**		400 K
Coaxial sample holders require one FT-BNC or FT-TRIAX feedthrough as listed below Triaxial sample holders require one FT-TRIAX feedthrough as listed below **Requires optical feed through as listed below †For PS-LL-CPX option only; one included with option

Part number (probe body)	Description
FT-BNC	Coaxial feedthrough and coaxial cable, installed and wired
FT-TRIAX	Triaxial feedthrough and coaxial cable, installed and wired
FT-OPTIC*	Optical access kit—includes window, window holder, tower and related components
*Not compatible with the PS-HTA high temperature sample stage