The Model CPX-HF is a versatile cryogenic micromanipulated probe station used for non-destructive magnetic testing of devices on full and partial wafers up to 25 mm (1 in) in diameter. The CPX-HF is a platform for measurement of magneto-transport, electrical, electrooptical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, semiconductors, superconductors, and spintronic devices are typical materials measured in a CPX-HF. A wide selection of probes, cables, sample holders, and options makes it possible to configure the CPX-HF to meet your specific measurement applications.
Mounted on a non-magnetic table, the CPX-HF is equipped with a 10 kOe (1 T) horizontal split-pair superconducting magnet. The CPX-HF operates over a temperature range of 4.2 K to 400 K. With options, the base temperature can be extended down to 2 K. The probe station provides efficient temperature operation and control with a continuous refrigeration system using either helium or nitrogen*. Vapor-cooled shielding optimizes efficiency and intercepts blackbody radiation before it reaches the sample. A control heater on the sample stage along with the magnet stage and radiation shield heaters provides the probe station with fast thermal response.
The CPX-HF is user configured with up to four ultrastable micro-manipulated stages, each providing precise 3-axis control of the probe position to accurately land the probe tip on device features. Proprietary probe tips in a variety of sizes and materials minimize thermal mass and optimize electrical contacts to the device under test.
For increased versatility, CPX-HF options include a 2 K base temperature stage, high vacuum, vibration isolation systems, LN2 Dewar kit*, higher magnification microscope, vacuum turbo pumping system, and fiber optic probe arm modification.
*LHe required to operate magnet
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