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​Lake Shore exhibiting optical device test & measurement products at SPIE event
SPIE O+P 2017

Lake Shore Cryotronics will be attending the SPIE Optics + Photonics Exhibition in San Diego, Aug. 6 – 10, to discuss a range of platforms optimized for the study of early-stage optical materials and devices.

High-performance solutions from Lake Shore include:

  • Cryogenic probe stations for performing electro-optical, DC, RF, microwave, and THz-frequency (75 GHz and up) measurements of materials and devices, including photovoltaic materials and semiconductor optoelectronic devices, in a controlled, variable temperature environment. These versatile test platforms provide superior results and productivity when compared to traditional methods requiring manual immersion of devices in liquid nitrogen. Versions include cryogen-free (CCR-based) models, integrated in-plane and out-of-plane magnet models, and stations supporting backside optical illumination of a sample (ideal for examining photosensitive materials with topside metallization). On display in Booth 460 will be the Model TTPX, an entry-level cryogenic probe station well-suited for a wide variety of device measurements.
  • Hall effect measurement systems for determining the mobility and carrier concentration of materials, including wafer-scale materials, as a function of temperature and field. These robust systems facilitate a broad range of research applications, including photovoltaic, organic electronic, transparent conducting oxide, III-V, and III-VI semiconductor research, and include an AC field Hall option for characterizing materials with very low mobilities. Systems can also be specified with high and low resistance, variable temperature, and oven options, as well as optical access for exposure of samples to different wavelengths of light via a laser or a fiber optic connection.
  • Soon-to-be-released MeasureReady™ Model 155 precision I/V sources. Ideal for any application requiring a high-quality, low-noise source of current or voltage, these innovative instruments provide a solid foundation for DC I-V and C-V curve, AC impedance, Hall effect, resistance, resistivity, and other fundamental material measurements. In addition, they support very low power excitation of sensitive materials, like organics, and controlled characterization of low-resistance and superconducting materials. They are also very simple to operate, with a smartphone-based touchscreen interface, allowing for quick setup and use in labs regularly performing rapid testing of various devices.

For more about these products, visit www.lakeshore.com.